Overview
- Most advanced state-of-the-art report on scanning probe microscopy
- Presents the latest developments in STM and AFM
- Deals with the various classes of materials studied
- A valuable reference work for researchers as well as a study text for graduate students
Part of the book series: NanoScience and Technology (NANO)
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About this book
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
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Keywords
Table of contents (18 chapters)
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Front Matter
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Back Matter
Editors and Affiliations
Bibliographic Information
Book Title: Noncontact Atomic Force Microscopy
Book Subtitle: Volume 2
Editors: Seizo Morita, Franz J. Giessibl, Roland Wiesendanger
Series Title: NanoScience and Technology
DOI: https://doi.org/10.1007/978-3-642-01495-6
Publisher: Springer Berlin, Heidelberg
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2009
Hardcover ISBN: 978-3-642-01494-9Published: 01 October 2009
Softcover ISBN: 978-3-642-26070-4Published: 14 March 2012
eBook ISBN: 978-3-642-01495-6Published: 18 September 2009
Series ISSN: 1434-4904
Series E-ISSN: 2197-7127
Edition Number: 1
Number of Pages: XVIII, 401
Number of Illustrations: 28 b/w illustrations, 77 illustrations in colour
Topics: Nanotechnology and Microengineering, Spectroscopy and Microscopy, Theoretical and Applied Mechanics, Nanotechnology, Engineering, general, Condensed Matter Physics