Abstract
Results presented in the following show structural analysis of metaloxide surfaces and the extraction of physical quantities from the force field above such a surface by noncontact atomic force microscopy (NC-AFM). The measurements have been performed with our dual mode NC-AFM/STM in ultrahigh vacuum at 5 K. The introduction will be followed by a description of the experimental setup, including the ultrahigh vacuum cryogenic environment and our tuning fork tunneling current and force sensor. The sensor parameters affecting the measurements are given together with an amplitude characterization method. In the next section, a structure determination of ultrathin Alumina/NiAl(110) is shown. Atomic resolution could be achieved throughout both reflection domain unit cells. NC-AFM reveals details of morphological features, interconnections to substrate–film interactions, and comparability to theory also with respect to topographic height. In the last section, we present measurements beyond imaging, namely spectroscopy data taken on thin MgO films grown on Ag(001). Force–distance measurements based on atomically resolved NC-AFM images of these films have been taken. Inequivalent sites could be resolved and their effect on nucleation and adsorption processes is debated. Furthermore, work function shift measurements on different MgO film thicknesses grown on Ag(001) are studied and the impact of this shift on the catalytic properties of adsorbed metal species is discussed.
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References
H.-J. Freund, Faraday Discuss. 114, 1 (1999)
G.H. Simon, M. Heyde, H.-P. Rust, Nanotechnology 18, 255503 (2007)
B. Yoon et al., Science 307, 403 (2005)
G. Binnig, C.F. Quate, G. Gerber, Phys. Rev. Lett. 56, 930 (1986)
M. Heyde, M. Kulawik, H.-P. Rust, H.-J. Freund, Rev. Sci. Instrum. 75, 2446 (2004)
M. Heyde, M. Sterrer, H.-R. Rust, H.-J. Freund, Appl. Phys. Lett. 87, 083104 (2005)
H.-P. Rust, M. Heyde, H.-J. Freund, Rev. Sci. Instrum. 77, 043710 (2006)
M. Heyde, G.H. Simon, H.-P. Rust, H.-J. Freund, Appl. Phys. Lett. 89, 263107 (2006)
Nanosurf AG, Grammetstrasse 14, CH-4410 Liestal, Swiss.
K. Kobayashi et al., Rev. Sci. Instrum. 72, 4383 (2001)
B. Gotsmann, H. Fuchs, Appl. Surf. Sci. 188, 355 (2002)
T.R. Albrecht, P. Grütter, D. Horne, D. Rugar, J. Appl. Phys. 69, 668 (1991)
Nanotec Electronica, Parque Cientifico de Madrid, Pabellon C, campus UAM, Cantoblanco, E-28049 Madrid, Spain.
Nanonis GmbH, Technoparkstrasse 1, CH-8005 Zurich, Swiss.
J.E. Sader, S.P. Jarvis, Appl. Phys. Lett. 84, 1801 (2004)
U. Dürig, Appl. Phys. Lett. 75, 433 (1999)
F.J. Giessibl, Appl. Phys. Lett. 78, 123 (2001)
J.P. Cleveland, S. Manne, D. Bocek, P.K. Hansma, Rev. Sci. Instrum. 64, 403 (1993)
F.J. Giessibl, Science 267, 68 (1995)
C. Loppacher et al., Appl. Surf. Sci. 140, 287 (1999)
R. Bennewitz et al., Phys. Rev. B 62, 2074 (2000)
C. Barth, C.R. Henry, Phys. Rev. Lett. 91, 196102 (2003)
C. Barth, M. Reichling, Nature 414, 54 (2001)
C.L. Pang, H. Raza, S.A. Haycock, G. Thornton, Phys. Rev. B 65, 201401(R) (2002)
G. Hamm et al., Phys. Rev. Lett. 97, 126106 (2006)
S. Gritschneder, C. Becker, K. Wandelt, M. Reichling, J. Am. Chem. Soc. 129, 4925 (2007)
S. Gritschneder et al., Phys. Rev. B 76, 014123 (2007)
G.H. Simon et al., Phys. Rev. B 78, 113401 (2008)
R.M. Jaeger et al., Surf. Sci. 259, 235 (1991)
M. Kulawik, N. Nilius, H.-P. Rust, H.-J. Freund, Phys. Rev. Lett. 91, 256101 (2003)
S. Andersson et al., Surf. Sci. 442, L964 (1999)
H. Isern, G.R. Castro, Surf. Sci. 211, 865 (1989)
J.-P. Jacobs et al., J. Vac. Sci. Technol. A 12, 2308 (1994)
J. Libuda et al., Surf. Sci. 318, 61 (1994)
A. Sandell et al., J. Electron Spectrosc. Relat. Phenom. 76, 301 (1995)
G. Ceballos et al., Chem. Phys. Lett. 359, 41 (2002)
S. Ulrich, N. Nilius, H.-J. Freund, Surf. Sci. 601, 4603 (2007)
T. Nishimura, Y. Hoshino, T. Okazawa, Y. Kido, Phys. Rev. B 77, 073405 (2008)
G. Kresse et al., Science 308, 1440 (2005)
T. Bertrams, A. Brodde, H. Neddermeyer, J. Vac. Sci. Technol. B 12, 2122 (1994)
K.F. McCarty, J.P. Pierce, B. Carter, Appl. Phys. Lett. 88, 141902 (2006)
M. Schmid et al., Phys. Rev. Lett. 97, 046101 (2006)
M. Kulawik, N. Nilius, H.-J. Freund, Phys. Rev. Lett. 96, 036103 (2006)
N. Nilius et al., Phys. Rev. Lett. 100, 096802 (2008)
M. Morgenstern et al., Phys. Rev. B 62, 7257 (2000)
B.C. Stipe, M.A. Rezaei, W. Ho, Science 280, 1732 (1998)
A. Hewson, From the Kondo Effect to Heavy Fermions (Cambridge University Press, Cambridge, 1993)
H.A. Mizes, J.S. Foster, Science 244, 559 (1989)
C.G. Slough et al., Phys. Rev. B 34, 994 (1986)
M. Sterrer et al., J. Phys. Chem. B 110, 46 (2006)
M. Sterrer et al., Phys. Rev. Lett. 98, 096107 (2007)
M. Yulikov et al., Phys. Rev. Lett. 96, 146804 (2006)
G. Pacchioni, L. Giordano, M. Baistrocchi, Phys. Rev. Lett. 94, 226104 (2005)
D. Ricci, A. Bongiorno, G. Pacchioni, U. Landman, Phys. Rev. Lett. 97, 036106 (2006)
M. Radmacher et al., Biophys. J. 66, 2159 (1994)
D.R. Baselt, J.D. Baldeschwieler, J. Appl. Phys. 76, 33 (1994)
D.D. Koleske et al., Rev. Sci. Instrum. 66, 4566 (1995)
S. Morita, Y. Sugawara, K. Yokoyama, T. Uchihashi, Nanotechnology 11, 120 (2000)
A. Schirmeisen, D. Weiner, H. Fuchs, Phys. Rev. Lett. 97, 136101 (2006)
T. Minobe et al., Appl. Surf. Sci. 140, 298 (1999)
H. Hölscher, S.M. Langkat, A. Schwarz, R. Wiesendanger, Appl. Phys. Lett. 81, 4428 (2002)
S.M. Langkat, H. Hölscher, A. Schwarz, R. Wiesendanger, Surf. Sci. 527, 12 (2003)
A.I. Livshits, A.L. Shluger, A.L. Rohl, A.S. Foster, Phys. Rev. B 59, 2436 (1999)
P.V. Sushko, A.L. Shluger, C.R.A. Catlow, Surf. Sci. 450, 153 (2000)
A. Sanchez et al., J. Phys. Chem. A 103, 9573 (1999)
L. Giordano, F. Cinquini, G. Pacchioni, Phys. Rev. B 73, 045414 (2005)
V. Simic-Milosevic et al., J. Am. Chem. Soc. 130, 7814 (2008)
H.-J. Freund, Surf. Sci. 601, 1438 (2007)
J. Goniakowski, C. Noguera, Interface Sci. 12, 93 (2004)
Y.-C. Yeo, T.-J. King, C. Hu, J. Appl. Phys. 92, 7266 (2002)
G. Binnig, H. Rohrer, Surf. Sci. 126, 236 (1983)
K.H. Gundlach, Solid-State Electron. 9, 949 (1966)
G. Binnig, H. Roherer, Helv. Phys. Acta 55, 726 (1982)
O.Y. Kolesnychenko, Y.A. Kolesnichenko, O. Shklyarevskii, H. van Kempen, Physica B 291, 246 (2000)
N.D. Lang, Phys. Rev. B 37, 10395 (1988)
C.J. Chen, Introduction to Scanning Tunneling Microscopy (Oxford University Press, New York, 1993)
L. Olesen et al., Phys. Rev. Lett. 76, 1485 (1996)
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Heyde, M., Simon, G.H., König, T. (2009). Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond. In: Morita, S., Giessibl, F., Wiesendanger, R. (eds) Noncontact Atomic Force Microscopy. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-01495-6_7
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