Abstract
Since the publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM), which can image even insulators with atomic resolution, has achieved remarkable progress. This second volume deals with the following outstanding results obtained with atomic resolution after the publication of the previous books: (1) Force Spectroscopy and Force-Mapping with Atomic Resolution, (2) Tuning Fork/qPlus Sensor, (3) Atomic Manipulation, (4) Magnetic Exchange Force Microscopy, (5) Atomic and Molecular Imaging in Liquids, (6) New Technologies in Dynamic Force Microscopy. These results and technologies are now varying the NC-AFM with imaging function on an atomic scale toward characterization and manipulation tools of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the NC-AFM is now becoming a crucial tool for nanoscience and nanotechnology.
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Morita, S. (2009). Introduction. In: Morita, S., Giessibl, F., Wiesendanger, R. (eds) Noncontact Atomic Force Microscopy. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-01495-6_1
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DOI: https://doi.org/10.1007/978-3-642-01495-6_1
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