59th Electronic Materials Conference 2017
In this topical collection (12 articles)
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Topical Collection: 59th Electronic Materials Conference 2017
Mapping of Lattice Strain in 4H-SiC Crystals by Synchrotron Double-Crystal X-ray Topography
Jianqiu Guo, Yu Yang, Balaji Raghothamachar… Pages 903-909 -
Topical Collection: 59th Electronic Materials Conference 2017
Metalorganic Vapor-Phase Epitaxy Growth Parameters for Two-Dimensional MoS2
M. Marx, A. Grundmann, Y.-R. Lin, D. Andrzejewski… Pages 910-916 -
Topical Collection: 59th Electronic Materials Conference 2017
Deposition of Methylammonium Lead Triiodide by Resonant Infrared Matrix-Assisted Pulsed Laser Evaporation
E. Tomas Barraza, Wiley A. Dunlap-Shohl, David B. Mitzi… Pages 917-926 -
Topical Collection: 59th Electronic Materials Conference 2017
Electrical Characteristics of 10-kV 4H-SiC MPS Rectifiers with High Schottky Barrier Height
Yifan Jiang, Woongje Sung, Jayant Baliga, Sizhen Wang… Pages 927-931 -
Topical Collection: 59th Electronic Materials Conference 2017
Photoelectrochemical Water Oxidation by GaAs Nanowire Arrays Protected with Atomic Layer Deposited NiO x Electrocatalysts
Joy Zeng, Xiaoqing Xu, Vijay Parameshwaran, Jon Baker… Pages 932-937 -
Topical Collection: 59th Electronic Materials Conference 2017
Characterization of Strain Due to Nitrogen Doping Concentration Variations in Heavy Doped 4H-SiC
Yu Yang, Jianqiu Guo, Balaji Raghothamachar… Pages 938-943 -
Topical Collection: 59th Electronic Materials Conference 2017
Dependence of Internal Crystal Structures of InAs Nanowires on Electrical Characteristics of Field Effect Transistors
Sangmoon Han, Ilgyu Choi, Kwanjae Lee, Cheul-Ro Lee… Pages 944-948 -
Topical Collection: 59th Electronic Materials Conference 2017
Photoconductive ZnO Films Printed on Flexible Substrates by Inkjet and Aerosol Jet Techniques
D. J. Winarski, E. Kreit, E. M. Heckman, E. Flesburg… Pages 949-954 -
Topical Collection: 59th Electronic Materials Conference 2017
DLTS Analysis and Interface Engineering of Solution Route Fabricated Zirconia Based MIS Devices Using Plasma Treatment
Arvind Kumar, Sandip Mondal, K. S. R. Koteswara Rao Pages 955-960 -
Topical Collection: 59th Electronic Materials Conference 2017
Formation Mechanism of Atomically Flat Si(100) Surface by Annealing in Ar/H2 Ambient
Sohya Kudoh, Shun-ichiro Ohmi Pages 961-965 -
Topical Collection: 59th Electronic Materials Conference 2017
Shape Evolution of Highly Lattice-Mismatched InN/InGaN Nanowire Heterostructures
Lifan Yan, Arnab Hazari, Pallab Bhattacharya… Pages 966-972 -
Topical Collection: 59th Electronic Materials Conference 2017
Free-Standing β-Ga2O3 Thin Diaphragms
Xu-Qian Zheng, Jaesung Lee, Subrina Rafique, Lu Han… Pages 973-981
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