Abstract
In this work we focus on the use of SVMs for monitoring techniques applied to nonlinear profiles in the Statistical Process Control (SPC) framework. We develop a new methodology based on Functional Data Analysis for the construction of control limits for nonlinear profiles. In particular, we monitor the fitted curves themselves instead of monitoring the parameters of any model fitting the curves. The simplicity and effectiveness of the data analysis method has been tested against other statistical approaches using a standard data set in the process control literature.
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Moguerza, J.M., Muñoz, A., Psarakis, S. (2007). Monitoring Nonlinear Profiles Using Support Vector Machines. In: Rueda, L., Mery, D., Kittler, J. (eds) Progress in Pattern Recognition, Image Analysis and Applications. CIARP 2007. Lecture Notes in Computer Science, vol 4756. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-76725-1_60
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DOI: https://doi.org/10.1007/978-3-540-76725-1_60
Publisher Name: Springer, Berlin, Heidelberg
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