Overview
- First book to address the effect of device reliability and process variations on the RF circuit performance degradations
- Present of all kinds RF circuits in the reliability examination
- Includes analytical equations, experimental data and simulation results
- Includes supplementary material: sn.pub/extras
Part of the book series: SpringerBriefs in Applied Sciences and Technology (BRIEFSAPPLSCIENCES)
Part of the book sub series: SpringerBriefs in Reliability (SBR)
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About this book
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
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Keywords
Table of contents (10 chapters)
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Front Matter
Authors and Affiliations
Bibliographic Information
Book Title: CMOS RF Circuit Design for Reliability and Variability
Authors: Jiann-Shiun Yuan
Series Title: SpringerBriefs in Applied Sciences and Technology
DOI: https://doi.org/10.1007/978-981-10-0884-9
Publisher: Springer Singapore
eBook Packages: Engineering, Engineering (R0)
Copyright Information: The Author(s) 2016
Softcover ISBN: 978-981-10-0882-5Published: 21 April 2016
eBook ISBN: 978-981-10-0884-9Published: 13 April 2016
Series ISSN: 2191-530X
Series E-ISSN: 2191-5318
Edition Number: 1
Number of Pages: VI, 106
Number of Illustrations: 101 b/w illustrations
Topics: Circuits and Systems, Electronic Circuits and Devices, Microwaves, RF and Optical Engineering