Abstract
The characterization of diopside –based glass of the composition Cu0.50Ca0.75Mg0.75Si2O6 containing small additions of Cr2O3 or TiO2 was explored. The techniques used for the characterization process include AC conductivity (σac), X-ray diffraction (XRD) and Scanning electron microscopy (SEM). However, the prepared dark green glasses show very little devitrification of traces diopside, cuprite and tenorite. The SEM shows a massive structure at the nanoscale with little scattered clusters of nano crystals of the latter phases. The σac was measured within the frequency range of 0.042 kHz −1 MHz and at the temperature range of 298–573 (K). The electrical conductivity measurements proved that the incorporation of Cr2O3 and TiO2 results in higher conductivity values than those of the free glass sample. The activation energy of each of these glasses was estimated at high temperature range. The calculated activation energy values measured at 100 kHz and 1 MHz of the glass samples lie in the range 0.55–0.98 (eV). The prepared glass samples exhibited semiconducting nature.
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The authors are grateful to the National Research Centre, the institution to which they belong, for providing the facilities that the current research required.
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Reham M.M. Morsi, has carried out the AC conductivity measurements, their discussions and conclusions. Gehan T. El-Bassyouni and Esmat M. A. Hamzawy prepared the samples, their XRD, SEM and their discussions and conclusions. All the authors contributed in writing the original manuscript.
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Morsi, R.M., El-Bassyouni, G.T. & Hamzawy, E.M.A. Characterization Properties of Diopside Glass (Cu0.50Ca0.75Mg0.75Si2O6) Containing Cr2O3 or TiO2. Silicon 14, 5923–5929 (2022). https://doi.org/10.1007/s12633-021-01370-3
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DOI: https://doi.org/10.1007/s12633-021-01370-3