Overview
Offers comprehensive treatment of the use of ion beams in material science research
Includes numerous tables, graphs and illustrations that amplify the text
Provides optimization strategies for solid-state properties of functional materials
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Table of contents (7 chapters)
Authors and Affiliations
About the authors
Bernd Schmidt received his PhD in Physics at the State University of St. Petersburg (Russia) in 1976. Since 1994 he has been head of the Process Technology Division at the Helmholtz-Zentrum Dresden-Rossendorf, Germany. His research interests include semiconductor technology as well as ion implantation and the synthesis of nanostructures. He is author of the specialist book "Silicon Sensors" (1986) and of more than 150 refereed journal papers.
Klaus Wetzig received his PhD (1967) and postdoctoral (1973) degrees in Physics at the TU Dresden, Germany. From 1992 until his retirement in 2006 he was full professor of Materials Analysis at the TU Dresden and research director at the Leibniz Institute for Solid State and Materials Research Dresden (IFW). His research interests include materials analysis, nanostructures and particle-solid interactions. He is author of several specialist books and of more than 300 refereed journal papers.
Bibliographic Information
Book Title: Ion Beams in Materials Processing and Analysis
Authors: Bernd Schmidt, Klaus Wetzig
DOI: https://doi.org/10.1007/978-3-211-99356-9
Publisher: Springer Vienna
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Wien 2013
Hardcover ISBN: 978-3-211-99355-2Published: 13 December 2012
Softcover ISBN: 978-3-7091-1733-0Published: 28 November 2014
eBook ISBN: 978-3-211-99356-9Published: 13 December 2012
Edition Number: 1
Number of Pages: IX, 418
Topics: Surfaces and Interfaces, Thin Films, Atomic, Molecular, Optical and Plasma Physics, Surface and Interface Science, Thin Films