Abstract
A gamma process model is widely used to estimate reliability of general systems using non-destructive degradation data. However, the daunting challenge is the application of the model to one-shot systems given that recursive measurements are unavailable and degradation trends over time are nonlinear. This study shows a storage reliability estimation method of one-shot systems using accelerated destructive degradation data when information of either chemical reaction or degradation trend is unknown. An n-th kinetic model, which is a Physics-based model, was used to evaluate the degradation phenomenon of one-shot systems using destructive degradation data. The accelerated degradation model was constructed to estimate storage reliability for normal storage temperature. The proposed method was applied to estimate storage reliability of IR flare using the stabilizer contents that were destructively measured over time at three temperature levels. The real application results show applicability of the proposed method.
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Y. Zhang and H. Liao, Analysis of destructive degradation tests for a product with random degradation initiation time, IEEE Transactions on Reliability, 64 (1) (2015) 516–527.
S. D. Guikema, A comparison of reliability estimation methods for binary systems, Reliability Engineering & System Safety, 87 (2005) 365–376.
S.-J. Back, Y.-K. Son, S.-H. Lim and I.-H. Myung, Storage life estimation of magnesium flare material for 81 mm illuminating projectile, Journal of the Korea Institute of Military Science and Technology, 18 (3) (2015) 267–274.
K. A. Patekar, Long term degradation of resin for high temperature composites, Massachusetts Institute of Technology USA (1998).
Y. Leterrier, B. Singh, J. Boucher, J.-A. E. Manson, G. Rochat and P. Fayet, Supertough UV-curable silane/silica gas barrier coatings on polymers, Surface & Coatings Technology, 203 (2009) 3398–3304.
L. Jelisavac, Life-time prediction of double-base propellants in accordance with Serbian an NATO Standards, Scientific Technical Review, 60 (1) (2010) 12–18.
G. J. Savage and Y.-K. Son, The set-theory method for systems reliability of structures with degrading components, Reliability Engineering and System Safety, 96 (2011) 108–116.
R. T. Magari, K. P. Murphy and T. Fernandez, Accelerated stability model for predicting Shelf-life, Journal of Clinical Laboratory Analysis, 16 (5) (2002) 221–226.
H. Liao and A. E. Elsayed, Reliability interference for field conditions from accelerated degradation testing, Naval Research Logistics, 53 (6) (2006) 577–587.
B. Zheng, F. Cai and J. Xu, Evaluation of system storage reliability, International Journal of Systems & Cybernetics, 33 (2) (2004) 438–445.
M. A. Bohn, NC-based energetic materials - stability, decomposition, and ageing, Nitrocellulose - Supply, Ageing and Characterization Meeting, 24-25 April (2007).
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Young Kap Son received his Ph.D. from the Department of Systems Design Engineering in 2006 at the University of Waterloo, Canada. He is currently an Associate Professor in Mechanical & Automotive Engineering at the Andong National University, Korea. His research interests include probabilistic design of uncertain dynamic systems and reliability estimation of weapon systems.
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Son, Y.K., Kwon, T. Storage reliability estimation of one-shot systems using accelerated destructive degradation data. J Mech Sci Technol 30, 4439–4442 (2016). https://doi.org/10.1007/s12206-016-0908-9
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DOI: https://doi.org/10.1007/s12206-016-0908-9