Abstract
The structure and migration mechanisms of planar interfaces are examined geometrically using the concept of edge-to-edge matching of lattice planes and the Moiré plane approach derived from this concept. The selected examples of planar interfaces include those associated with rational, nearrational, or irrational orientation relationships. It is demonstrated that the orientation and structure of planar interfaces associated with these orientation relationships can be rationalized by the Moiré plane approach, and that the migration of these interfaces in their normal directions can occur via successive nucleation and lateral gliding of growth ledges that are in the form of transformation disconnections, for low-index interfaces, and of Moiré ledges, for high-index interfaces. It is further demonstrated that a shear, and thus a shape change, is associated with the motion of all planar interfaces defined by the edge-to-edge matching of lattice planes.
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This article is based on a presentation made in the “Hume-Rothery Symposium on Structure and Diffusional Growth Mechanisms of Irrational Interphase Boundaries,” which occurred during the TMS Winter meeting, March 15–17, 2004, in Charlotte, NC, under the auspices of the TMS Alloy Phases Committee and the co-sponsorship of the TMS-ASM Phase Transformation Committee.
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Nie, J.F. Edge-to-edge matching of lattice planes and coupling of crystallography and migration mechanisms of planar interfaces. Metall Mater Trans A 37, 841–849 (2006). https://doi.org/10.1007/s11661-006-0057-3
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DOI: https://doi.org/10.1007/s11661-006-0057-3