Abstract
Several software reliability growth models (SRGM) have been developed to monitor the reliability growth during the testing phase of software development. In most of the existing research available in the literatures, it is considered that a similar testing effort is required on each debugging effort. However, in practice, different types of faults may require different amounts of testing efforts for their detection and removal. Consequently, faults are classified into three categories on the basis of severity: simple, hard and complex. This categorization may be extended to r type of faults on the basis of severity. Although some existing research in the literatures has incorporated this concept that fault removal rate (FRR) is different for different types of faults, they assume that the FRR remains constant during the overall testing period. On the contrary, it has been observed that as testing progresses, FRR changes due to changing testing strategy, skill, environment and personnel resources. In this paper, a general discrete SRGM is proposed for errors of different severity in software systems using the change-point concept. Then, the models are formulated for two particular environments. The models were validated on two real-life data sets. The results show better fit and wider applicability of the proposed models as to different types of failure datasets.
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D. N. Goswami received the M.Sc. and Ph.D. degrees in computer applications in 1989 and 2004, respectively. He is currently working as reader and head of School of Studies in Computer Science and Applications, Jiwaji University, Gwalior. He has been into teaching for 15 years, and published a number of papers in national and international journals.
His research interests include software reliability and network security.
Sunil K. Khatri received the Master degree in computer applications from Rani Durgavati University, Jabalpur in 1999, and is a Ph.D. candidate in software reliability of Jiwaji University, Gwalior. His Ph.D. research area is discrete software reliability growth modeling. He is a senior lecturer at Department of Computer Science, Mother Teresa Institute of Management, GGSIP University. He has been into teaching for 8 years.
His research interests include software engineering, data mining, and computer network security.
Reecha Kapur is a research scholar at Department of Mathematics and Computer Application, Bundelkhand University, Jhansi, India. She has done her Post Graduation in mathematics from Bundelkhand University, Jhansi, India. She has published three research papers.
Her research interests include imperfect debugging models in software reliability and its effect on software testing cost.
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Goswami, D.N., Khatri, S.K. & Kapur, R. Discrete software reliability growth modeling for errors of different severity incorporating change-point concept. Int J Automat Comput 4, 396–405 (2007). https://doi.org/10.1007/s11633-007-0396-6
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DOI: https://doi.org/10.1007/s11633-007-0396-6