Abstract
Microcontact measurement is employed to locally investigate the electric and dielectric properties of individual grains and grain boundaries in CaCu3Ti4O12 ceramic. The measurements give more detail of the impedance spectroscopy, capacitance, and I–V characteristics of the microstructure, and will help with further understanding of the mechanism of the electric and dielectric properties of CaCu3Ti4O12 ceramics.
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Subramanian M A, Li D, Duan N, et al. High dielectric constant in ACu3Ti4O12 and ACu3Ti3FeO12 phases. J Solid State Chem, 2002, 151: 323–325
Ramirez A P, Subramanian M A, Gardel M, et al. Giant dielectric constant response in a copper titanate. Solid State Commun, 2000, 115: 217–220
Homes C C, Vogt T, Shapiro S M, et al. Optical response of high dielectric constant perovskite-related oxide. Science, 2001, 293: 673–676
Sinclair D C, Adams T B, Morrison F D, et al. CaCu3Ti4O12: One step internal barrier layer capacitor. Appl Phys Lett, 2002, 80: 2153–2155
Li J, Sleight A W, Subramanian M A. Evidence for internal resistive barriers in a crystal of the giant dielectric constant material: Ca-Cu3Ti4O12. Solid State Commun, 2005, 135: 260–262
Adams T B, Sinclair D C, West A R. Giant barrier layer capacitance effect in CaCu3Ti4O12. Adv Mater, 2002, 14: 1321–1323
Li J, Subramanian M A, Rosenfeld H D, et al. Clues to the giant dielectric constant of CaCu3Ti4O12 in the defect structure of SrCu3Ti4O12. Chem Mater, 2004, 16: 5223–5225
Chung S Y, Kim I L D, Kang S J L. Strong nonlinear current-voltage behaviour in perovskite-derivative calcium copper titanate. Nat Mater, 2004, 3: 774–778
Olsson E, Dunlop G L. The effect of Bi2O3 content on the microstructure and electrical properties of ZnO varistor materials. J Appl Phys, 1989, 66: 3666–3675
Fleig J, Rodewald S, Maier J. Microcontact impedance measurements of individual highly resistive grain boundaries: General aspects and application to acceptor-doped SrTiO3. J Appl Phys, 2000, 87: 2372–2381
Rodewald S, Fleig J, Maier J. Microcontact impedance spectroscopy at single grain boundaries in Fe-Doped SrTiO3 polycrystals. J Am Ceram Soc, 2001, 84: 521–530
Skapin S A, Jamnik J, Pejovnik S. Grain boundary conductance in AgCl gained by micro-contact impedance spectroscopy. Solid State Ionics, 2000, 133: 129–138
Jonscher A K. Admittance spectroscopy of systems showing low-frequency dispersion. Electrochimica Acta, 1990, 35: 1595–1600
Wang C C, Zhang L W. Polaron relaxation related to localized charge carriers in CaCu3Ti4O12. Phys Rev B, 2007, 90: 142905
Grueter F, Blatter G. Electrical properties of grain boundaries in polycrystalline compound semiconductors. Semicond Sci Technol, 1990, 5: 111–137
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Luo, F., He, J., Hu, J. et al. Characterization of individual grain boundaries and grains of CaCu3Ti4O12 ceramic. Sci. China Technol. Sci. 55, 879–882 (2012). https://doi.org/10.1007/s11431-011-4738-9
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DOI: https://doi.org/10.1007/s11431-011-4738-9