Abstract.
Some applications of polymer films require the microstructuring of partly uneven substrates. This cannot be achieved by conventional photolithography, usually performed with ultraviolet short-pulse lasers (excimer, fourth harmonic Nd:YAG). When processing thermally sensitive or undoped polymers with low optical absorption, the use of femtosecond laser pulses can improve the ablation precision, also reducing the heat-affected zone. Therefore, a Ti:sapphire laser system was employed to perform ablation experiments on polyimide (PI). The irradiated areas were evaluated by means of optical and scanning electron microscopy. Highly oriented ripple structures, which are related to the polarization state of the laser pulses, were observed in the cavities. The relationship between the ablation threshold fluence and the number of laser pulses applied to the same spot is described in accordance with an incubation model.
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Received: 21 July 1999 / Accepted: 31 September 1999 / Published online: 22 December 1999
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Baudach, S., Bonse, J. & Kautek, W. Ablation experiments on polyimide with femtosecond laser pulses . Appl Phys A 69 (Suppl 1), S395–S398 (1999). https://doi.org/10.1007/s003390051424
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DOI: https://doi.org/10.1007/s003390051424