Article PDF
Similar content being viewed by others
Use our pre-submission checklist
Avoid common mistakes on your manuscript.
Author information
Authors and Affiliations
Additional information
Received: 25 July 1997/Accepted: 1 October 1997
Rights and permissions
About this article
Cite this article
Belaidi, S., Lebon, F., Girard, P. et al. Finite element simulations of the resolution in electrostatic force microscopy . Appl Phys A 66 (Suppl 1), S239–S243 (1998). https://doi.org/10.1007/s003390051138
Issue Date:
DOI: https://doi.org/10.1007/s003390051138