High resolution-ICPMS in fast scanning-mode: application for laser ablation analysis of zircon

Abstract

The general applicability of a double focusing sector field high resolution-inductively coupled mass spectrometry (HR-ICPMS) is evaluated for the precise and accurate determination of the abundances of rare earth elements (REE) in zircon by LA-ICPMS using a 266 nm UV-laser. “Zircon 91500”, a recently released new reference material for microanalytical work but with contradictory REE data is investigated with both the 266 nm laser and a 1024 nm IR-laser coupled to a quadrupole ICPMS. The data show evidence for a homogeneous distribution of the heavy REE. In contrast, in some “Zircon 91500” chips the trace elements Hf, Th, U are inhomogeneously distributed.