Abstract
Reliability-based design optimization (RBDO) is a methodology for finding optimized designs that are characterized with a low probability of failure. Primarily, RBDO consists of optimizing a merit function while satisfying reliability constraints. The reliability constraints are constraints on the probability of failure corresponding to each of the failure modes of the system or a single constraint on the system probability of failure. The probability of failure is usually estimated by performing a reliability analysis. During the last few years, a variety of different formulations have been developed for RBDO. Traditionally, these have been formulated as a double-loop (nested) optimization problem. The upper level optimization loop generally involves optimizing a merit function subject to reliability constraints, and the lower level optimization loop(s) compute(s) the probabilities of failure corresponding to the failure mode(s) that govern(s) the system failure. This formulation is, by nature, computationally intensive. Researchers have provided sequential strategies to address this issue, where the deterministic optimization and reliability analysis are decoupled, and the process is performed iteratively until convergence is achieved. These methods, though attractive in terms of obtaining a workable reliable design at considerably reduced computational costs, often lead to premature convergence and therefore yield spurious optimal designs. In this paper, a novel unilevel formulation for RBDO is developed. In the proposed formulation, the lower level optimization (evaluation of reliability constraints in the double-loop formulation) is replaced by its corresponding first-order Karush–Kuhn–Tucker (KKT) necessary optimality conditions at the upper level optimization. Such a replacement is computationally equivalent to solving the original nested optimization if the lower level optimization problem is solved by numerically satisfying the KKT conditions (which is typically the case). It is shown through the use of test problems that the proposed formulation is numerically robust (stable) and computationally efficient compared to the existing approaches for RBDO.
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Abbreviations
- \(\mathbf d\) :
-
design variables
- \(\mathbf p\) :
-
parameters in deterministic optimization
- \(\mathbf X\) :
-
random variables
- \(\mathbf U\) :
-
standard normal random variables
- \(\pmb{\theta}\) :
-
distribution parameters
- \(\pmb{\eta}\) :
-
limit-state parameters
- \(\mathbf {g}^R\) :
-
failure-driven or probabilistic hard constraints
- \(\mathbf {g}^D\) :
-
deterministic constraints
- \({\mathbf y}\) :
-
deterministic state variables
- \({\mathbf Y}\) :
-
random state variables
- \(\beta_i\) :
-
reliability index of \(i^{th}\) failure mode
- \(\mathbf x^* \) :
-
most probable point in \(\mathbf{x}\)-space
- \(\mathbf u^* \) :
-
most probable point in \(\mathbf{u}\)-space
- \(f\) :
-
merit function
- \(\mathbf g^{rc}\) :
-
reliability constraints
- \(P_i\) :
-
probability of failure of \(i^{th}\) failure mode
- \(P_{allow_i}\) :
-
allowable probability of failure for \(i^{th}\) failure mode
- \(P_{sys}\) :
-
system probability of failure
- \({\mathbf d}^l\) :
-
lower bounds on design variables
- \({\mathbf d}^u\) :
-
upper bounds on design variables
- \(N_{hard}\) :
-
number of hard constraints
- \(N_{soft}\) :
-
number of soft constraints
- \(\beta_{reqd_i}\) :
-
desired reliability index of \(i^{th}\) failure mode
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Agarwal, H., Mozumder, C.K., Renaud, J.E. et al. An inverse-measure-based unilevel architecture for reliability-based design optimization. Struct Multidisc Optim 33, 217–227 (2007). https://doi.org/10.1007/s00158-006-0057-3
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DOI: https://doi.org/10.1007/s00158-006-0057-3