Abstract
Transmission electron microscopic (TEM) studies are reported on Ag-clad Bi1.7 Pb0.4Sr1.8Ca2Cu3.5O x tapes prepared by using low purity (98–99%) commercial grade materials. The self-fieldJ c values of these tapes viz. 6.14 × 103 A.cm−2 at 77 K and 1.4 × 105 A.cm−2 at 4.2 K, reported in an earlier publication, were significantly higher than the correspondingJ c values in tapes prepared with high purity (99.99%) materials. The TEM pictures on the low purity core material of the tapes reveal the presence of stacking faults and the intergrowth of the 2212 and 2223 phases which could be acting as flux pinning sites and responsible for enhancedJ c values. These defects can perhaps be traced back to the presence of 60 ppm iron in the low purity CuO as revealed by atomic absorption analysis reported earlier.
Article PDF
Similar content being viewed by others
Avoid common mistakes on your manuscript.
References
S R Shukla, Y S Reddy and R G Sharma,Pramana-J. Phys,38, 179 (1992)
S R Shukla, Y S Reddy D K Pandya, Y Tanaka and R G Sharma,Pramana-J. Phys. 37, 333 (1991)
T Asano, Y Tanaka, M Fukotomi, K Jikihara and M Maeda,Jpn. J. Appl. Phys. 28, L595 (1988)
K Togano, H Kumakura, H Maeda, E Yanagisiwa, N Irisawa, J Shimoyama and T Morimoto,Jpn. J. Appl. Phys. 28, L95 (1989)
H Kumakura, K Togano, H Maeda and M MimuraJ. Appl. Phys. 67, 3443 (1990)
K Osamura, T Tokayama and S Ochiai,Cryogenics 29, 430 (1990)
H Dersch and G Blatter,Phys. Rev. B38, 11391 (1988)
H Tang, Z Q Qiu, Y W Du and J C Walker,J. Appl. Phys. 67, 4512 (1990)
R Wordenweber, G V S Sastry, K Heinemann and H C Freyhardt,J. Appl. Phys. 65, 1648 (1989)
S X Dou, Y C Gou and H K Liu,Physica C194, 343 (1992)
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Shukla, S.R., Reddy, Y.S., Kumar, N. et al. Further studies on Ag/BPSCCO tapes using low purity materials. Pramana - J. Phys. 41, 285–289 (1993). https://doi.org/10.1007/BF02847445
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF02847445