Abstract
The High-Voltage Electron Microscope (HVEM)-Accelerator Facility at Argonne National Laboratory (ANL) has been used to gain insight into the process of collapse of displacement cascades to vacancy loops in metals (Ni, Cu, Fe, Ni-Si, and Ni-Al) and the crystalline-amorphous transition produced in GaAs by ion implantation.
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R. Lyles, Jr., A. Taylor, K.L. Merkle, P. Okamoto, and P. Pronko:Proc. 9th lnt. Con. on Electron Microscopy, Toronto, 1978, vol. 1, pp. 76-77.
A. Taylor, C.W. Allen, and E.A. Ryan:Nucl. Instr. Methods in Physics Research, 1987, vol. B24/25, pp. 598–602.
K.C. Thompson-Russell and J.W. Edington:Electron Micro- scope Specimen Preparation Techniques in Materials Science, Philips Technical Library, Monograph 5, Eindhoven, 1977.
D.K. Saldin, A.Y. Stathopoulos, and M.J. Whelan:Philos. Trans. R. Soc. London, 1979, vol. 292, pp. 523–37.
B.L. Eyre, D.M. Maher, and R.C. Perrin:J. Phys. F, 1977, vol. 7, pp. 1359-69 and pp. 1371–82.
S.M. Holmes, B.L. Eyre, C.A. English, and R.C. Perrin:J. Phys. F, 1979, vol. 9, pp. 2307–33.
H.L. Heinisch:J. Nucl. Mater., 1981, vol. 103-04, pp. 1325–30.
T. Diaz de la Rubia, R.S. Averback, R. Benedek, and W.E. King:Phys. Rev. Lett., 1987, vol. 59, pp. 1930–33.
T. Diaz de la Rubia, R.S. Averback, R. Benedek, and I.M. Robertson:Proc. Workshop on Fusion Energy, Lugano, Switzerland, 1988.
C.P. Flynn and R.S. Averback:Phys. Rev., 1988, vol. B38, pp. 7118–21.
V.I. Protasov and V.G. Chudinov:Rad. Effects, 1982, vol. 66, pp. 1–7.
V.G. Kapinos and P.L. Platonov:Rad. Effects, 1987, vol. 103, pp. 45–57.
C.C. Mathai and D.J. Bacon:J. Nucl. Mater. 1985, vol. 135, pp. 173–80.
I.M. Robertson, M.A. Kirk, and Wayne E. King:Scripta Metall., 1984, vol. 18, pp. 317–20.
M.A. Kirk, I.M. Robertson, M.L. Jenkins, C.A. English, T.J. Black, and J.S. Vetrano:J. Nucl. Mater., 1987, vol. 149, pp. 21–28.
K. Haga, A.C. Baily, Wayne E. King, K.L. Merkle, and M. Meshii:7th. Int. Conf. on HVEM, 1983, pp. 139-44.
T.J. Black, M.L. Jenkins, C.A. English, and M.A. Kirk:Proc. R. Soc. London, 1987, vol. A409, pp. 177–98.
K. Kitagawa, K. Yamakawa, H. Fukushima, T. Yoshie, Y. Hayashi, H. Yoshida, Y. Shimomura, and M. Kiritani:J. Nucl. Mat., 1985, vols. 133 and 134, pp. 395–99.
H. Yoshida, Y. Hayashi, T. Maeda, K. Kitagawa, Y. Shimomura, and M. Kiritani:Annu. Rep. Res. Reactor Inst., Kyoto University, 1984, vol. 17, pp. 141–45.
P. Erhart and R.S. Averback: Univ. of Illinois, Urbana, IL, pri- vate communication, 1988.
B.C. Larson, T.S. Noggle, and J.F. Barhorst: MRS Fall Meet- ing, Boston, 1984.
L. DeSchepper, J. Cornelis, G. Knuyt, J. Nihoul, and L. Stals:Phys. Status Solidi A, 1980, vol. 61 (a), pp. 341–48.
T.J. Chandler and M.L. Jenkins:Micr. of Semiconductor Ma- terials, Inst. Phys. Conf. Ser., 1983, vol. 67, pp. 297–302.
D. Pons and J. Bourgoin:J. Phys. C, 1985, vol. 18, pp. 3839–71.
V.S. Speriosu, B.M. Paine, M.-A. Nicolet, and H.L. Glass:Appl. Phys. Lett., 1982, vol. 40, pp. 604–06.
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This paper is based on a presentation made in the symposium “Irradiation-Enhanced Materials Science and Engineering” presented as part of the ASM INTERNATIONAL 75th Anniversary celebration at the 1988 World Materials Congress in Chicago, IL, September 25-29, 1988, under the auspices of the Nuclear Materials Committee of TMS-AIME and ASM-MSD.
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Vetrano, J.S., Bench, M.W., Robertson, I.M. et al. In situ studies of ion irradiation effects in an electron microscope. Metall Trans A 20, 2673–2680 (1989). https://doi.org/10.1007/BF02670160
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DOI: https://doi.org/10.1007/BF02670160