Abstract
Electric transport properties of sputtered YBa2Cu3O7−δ films were studied as a function of screw dislocation density, ranging from 5·107 cm−2 to 1.3·109 cm−2 as determined at the film surface. A correlation was found between the number of screw dislocations and the critical current density (J c ). Films with higher screw dislocation densities have higher critical current densities and a slower drop ofJ c as a function of applied magnetic fieldH.
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Mannhart, J., Anselmetti, D., Bednorz, J.G. et al. Correlation betweenJ c and screw dislocation density in sputtered YBa2Cu3O7-δ films. Z. Physik B - Condensed Matter 86, 177–181 (1992). https://doi.org/10.1007/BF01313823
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DOI: https://doi.org/10.1007/BF01313823