Abstract
In recent years developments in the capabilities of techniques such as XPS and static SIMS have led to wider application of these methods for the characterisation of industrial materials. After a brief discussion of recent key developments of these techniques, this paper presents a selection of results from research work at our laboratory in the characterisation of organic film-forming corrosion inhibitors on a range of metal substrates which illustrate the nature of the information available. The inherent advantage ofsurface sensitivity and the advantages of a multi-technique approach for the evaluation of surface molecular structure from complex organic compounds is discussed. The additional benefits for analysis offered by the latest developments in technique are also demonstrated.
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Swift, A.J. Surface analysis of corrosion inhibitor films by XPS and ToFSIMS. Mikrochim Acta 120, 149–158 (1995). https://doi.org/10.1007/BF01244428
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DOI: https://doi.org/10.1007/BF01244428