Abstract
Indium-doped tin oxide films were prepared by the spray pyrolysis technique at different substrate temperatures ranging from 400–525 ‡C. Texture coefficients for (200) and (112) reflections of tetragonal SnO2 were calculated. The surface morphology of the prepared films was revealed by using scanning electron microscopy. A dendrite structure was observed in the films deposited at a substrate temperature of 525 ‡C. The obtained specific resistances were correlated with those obtained from X-ray diffraction analysis and scanning electron microscopy. A study of the effect of film thickness on the plane of preferred orientation was carried out.
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Afify, H.H., Terra, F.S. & Momtaz, R.S. Substrate temperature effects on the tin oxide films prepared by spray pyrolysis. J Mater Sci: Mater Electron 7, 149–153 (1996). https://doi.org/10.1007/BF00225638
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DOI: https://doi.org/10.1007/BF00225638