Abstract
Tin oxide films were deposited by spray pyrolysis on KBr and glass substrates. Conventional and high-resolution electron microscopy were used to determine grain sizes, atomic arrays and crystallographic details present in the films as a function of the growing parameters used. Optical and electrical properties were also measured and related to the structural details observed. The existence of SnO and Sn3O4 phases was revealed in films obtained at low substrate temperatures.
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Acosta, D.R., Maldonado, A. & Asomoza, R. Tin oxide films grown over glass and KBr at several substrate temperatures. J Mater Sci: Mater Electron 4, 187–191 (1993). https://doi.org/10.1007/BF00224738
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DOI: https://doi.org/10.1007/BF00224738