Abstract
Recent transmission electron microscopy (TEM) electron diffraction investigation of β-cristobalite has revealed a strong characteristic diffuse intensity distribution. In this work a similar, but less intense, diffuse scattering is reported for synthetic α-cristobalite. This material also displays both tetragonal twinning and characteristic striations correspond to planar boundaries which may exist on any {1, 0, l}tetragonal plane.
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Withers, R.L., Thompson, J.G. & Welberry, T.R. The structure and microstructure of α-cristobalite and its relationship to β-cristobalite. Phys Chem Minerals 16, 517–523 (1989). https://doi.org/10.1007/BF00202206
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DOI: https://doi.org/10.1007/BF00202206