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Low Temperature Scanning Force Microscopy

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Forces in Scanning Probe Methods

Part of the book series: NATO ASI Series ((NSSE,volume 286))

Abstract

Low temperature scanning force microscopy may become an important tool to study magnetic and superconducting materials and immobilized atoms and molecules on surfaces. The increased stability of the instrument and lower thermally activated oscillation amplitudes of the cantilever improve the force resolution. True atomic resolution experiments, modification experiments on the atomic scale and nuclear magnetic resonance experiments on single atoms seem feasible. However, instrumentation has remained a challenge. Only a few successfully working instruments have been described. We first discuss different types of cryostats and deflection sensors suitable for low temperature scanning force microscopy. Then we concentrate on low temperature magnetic force microscopy experiments on high transition temperature superconductors.

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Authors and Affiliations

  1. Institut für Physik, Universität Basel, Klingelbergstrasse 82, CH-4056, Basel, Switzerland

    H. J. Hug, A. Moser, O. Fritz, B. Stiefel & I. Parashikov

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    H. J. Güntherodt  & E. Meyer  & 

  2. Ciba Geigy Ltd., Central Research Services Physics, K-127.1.50, Basel, Switzerland

    D. Anselmetti

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Hug, H.J., Moser, A., Fritz, O., Stiefel, B., Parashikov, I. (1995). Low Temperature Scanning Force Microscopy. In: Güntherodt, H.J., Anselmetti, D., Meyer, E. (eds) Forces in Scanning Probe Methods. NATO ASI Series, vol 286. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-0049-6_3

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