Abstract
All software systems are built with basic components which interact with each other through predefined combination rules. As the number of components increases, the interactions between the components also increases exponentially which cause the combinatorial explosion problem. This mean complete (exhaustive) testing becomes unreasonable due to the huge number of possible combinations. Although 2-way interaction testing (i.e. pairwise testing) can relief and detect 50-97 percent of errors, empirical evidence has proved that 2-way interaction testing is a poor strategy for testing highly interactive systems and it has been showed that most of the errors are triggered by the interaction of 2-6 input parameters. In this paper we enhanced our previous strategy, “A Tree Based Strategy for Test Data Generation and Cost Calculation” by applying parallel algorithms to go beyond pairwise testing. The proposed strategy can support higher interaction testing. The designed algorithms are described in details with efficient empirical results.
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References
Kaner, C.: Exploratory Testing. In: Proc. of the Quality Assurance Institute Worldwide Annual Software Testing Conference, Orlando, FL (2006)
Bryce, R., Colbourn, C.J., Cohen, M.B.: A Framework of Greedy Methods for Constructing Interaction Tests. In: Proc. of the 27th International Conference on Software Engineering, pp. 146–155. St. Louis, MO, USA (2005)
Tsui, F.F., Karam, O.: Essentials of Software Engineering. Jones and Bartlett Publishers, Massachusetts, USA (2007)
Zamli, K.Z., Klaib, M.F.J., Younis, M.I., Isa, N.A.M., Abdullah, R.: Design and Implementation of a T-Way Test Data Generation Strategy with Automated Execution Tool Support. Information Sciences Journal (2011)
Hartman, A., Klinger, T., Raskin, L.: IBM Intelligent Test Configuration Handler. IBM Haifa and Watson Research Laboratories (2005b)
Hartman, A., Raskin, L.: Combinatorial Test Services (2004a), http://www.alphaworks.ibm.com/tech/cts (Accessed on August 2008)
Zamli, K.Z., Klaib, M.F.J., Younis, M.I.: G2Way: A Pairwise Test Data Generation Strategy with Automated Execution. Journal of Information and Communication Technology 9 (2010)
Klaib, M.F.J., Zamli, K.Z., Isa, N.A.M., Younis, M.I., Abdullah, R.: G2Way – A Backtracking Strategy for Pairwise Test Data Generation. In: Proc. of the 15th IEEE Asia-Pacific Software Engineering Conf, Beijing, China, pp. 463–470 (2008)
Lei, Y., Kacker, R., Kuhn, D.R., Okun, V., Lawrence, J.: IPOG: A General Strategy for T-Way Software Testing. In: Proc. of the 14th Annual IEEE Intl. Conf. and Workshops on the Engineering of Computer-Based Systems, Tucson, AZ, U.S.A, pp. 549–556 (2007)
Cohen, D.M., Dalal, S.R., Fredman, M.L., Patton, G.C.: The AETG System: An Approach to Testing Based on Combinatorial Design. IEEE Transactions on Software Engineering 23, 437–444 (1997)
Cohen, M.B., Snyder, J., Rothermel, G.: Testing Across Configurations: Implications for Combinatorial Testing. In: Proc. of the 2nd Workshop on Advances in Model Based Software Testing, Raleigh, North Carolina, USA, pp. 1–9 (2006)
Colbourn, C.J., Cohen, M.B., Turban, R.C.: A Deterministic Density Algorithm for Pairwise Interaction Coverage. In: Proc. of the IASTED Intl. Conference on Software Engineering, Innsbruck, Austria, pp. 345–352 (2004)
Tai, K.C., Lei, Y.: A Test Generation Strategy for Pairwise Testing. IEEE Transactions on Software Engineering 28, 109–111 (2002)
Shiba, T., Tsuchiya, T., Kikuno, T.: Using Artificial Life Techniques to Generate Test Cases for Combinatorial Testing. In: Proc. of the 28th Annual Intl. Computer Software and Applications Conf (COMPSAC 2004), Hong Kong, pp. 72–77 (2004)
Cohen, D.M., Dalal, S.R., Kajla, A., Patton, G.C.: The Automatic Efficient Test Generator (AETG) System. In: Proc. of the 5th International Symposium on Software Reliability Engineering, Monterey, CA, USA, pp. 303–309 (1994)
Lei, Y., Tai, K.C.: In-Parameter-Order: A Test Generation Strategy for Pairwise Testing. In: Proc. of the 3rd IEEE Intl. High-Assurance Systems Engineering Symp, Washington, DC, USA, pp. 254–261 (1998)
Lei, Y., Kacker, R., Kuhn, D.R., Okun, V., Lawrence, J.: IPOG/IPOD: Efficient Test Generation for Multi-Way Software Testing. Journal of Software Testing, Verification, and Reliability 18, 125–148 (2009)
Cohen, M.B.: Designing Test Suites for Software Interaction Testing. In: Computer Science, PhD University of Auckland New Zealand (2004)
Grindal, M., Offutt, J., Andler, S.F.: Combination Testing Strategies: a Survey. Software Testing Verification and Reliability 15, 167–200 (2005)
Younis, M.I., Zamli, K.Z., Mat Isa, N.A.: IRPS – An Efficient Test Data Generation Strategy for Pairwise Testing. In: Lovrek, I., Howlett, R.J., Jain, L.C. (eds.) KES 2008, Part I. LNCS (LNAI), vol. 5177, pp. 493–500. Springer, Heidelberg (2008)
Grindal, M.: Handling Combinatorial Explosion in Software Testing. Linkoping Studies in Science and Technology, Dissertation No. 1073, Sweden (2007)
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Klaib, M.F.J., Muthuraman, S., Noraziah, A. (2011). A Parallel Tree Based Strategy for T-Way Combinatorial Interaction Testing. In: Zain, J.M., Wan Mohd, W.M.b., El-Qawasmeh, E. (eds) Software Engineering and Computer Systems. ICSECS 2011. Communications in Computer and Information Science, vol 181. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-22203-0_8
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DOI: https://doi.org/10.1007/978-3-642-22203-0_8
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