Abstract
This paper presents a test methodology for mixed-signal circuits. The test approach uses a built-in sensor to analyze the dynamic current supply of the circuit under test. This current sensor emphasizes the highest harmonics of the dynamic current of the circuit under test when the current to voltage conversion is done. The goodness of the test method is analyzed first by means of a fault simulation and afterwards through the experimental data obtained from several benchmark circuits.
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Mozuelos, R., Lechuga, Y., Martínez, M., Bracho, S. (2010). Test Based on Built-In Current Sensors for Mixed-Signal Circuits. In: Camarinha-Matos, L.M., Pereira, P., Ribeiro, L. (eds) Emerging Trends in Technological Innovation. DoCEIS 2010. IFIP Advances in Information and Communication Technology, vol 314. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-11628-5_58
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DOI: https://doi.org/10.1007/978-3-642-11628-5_58
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-11627-8
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