Abstract
A general free-form surface inspection approach relying on the projection of a structured light pattern and the interpretation of the generated stripe structures by means of Fourier-based features is proposed in this paper.
The major concerns of this paper are the determination of various refrence sets of stripe patterns, and the detailed investigation on the subset of Fourier features that best characterizes free-form bright/dark structures. In order to tackle the inspection problem with a general approach, a first part of this paper is dedicated to the definition of different image data sets that correspond to various types of free-form specular shapes recorded with a structured illumination. A second part deals with the optimization of the most appropriate pattern recognition process. The optimization is dedicated to the use of different pattern arrangements, and the evaluation of different Fourier feature subsets.
It is shown that with only 10 Fourier features and a certain pattern arrangement, high classification rates of free-form surfaces can be obtained.
Access provided by Autonomous University of Puebla. Download to read the full chapter text
Chapter PDF
Similar content being viewed by others
Keywords
- Stripe Pattern
- Electronic Speckle Pattern Interferometry
- Surface Inspection
- Specular Surface
- Pattern Arrangement
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
References
Grunditz, C.H., Walder, M., Spaanenburg, L.: Constructing a Neural System for Surface Inspection. In: Proc. of IEEE Int. Joint Conf. on Neural Networks, vol. 3, pp. 1881–1886 (2004)
Reindl, I., OrsquoLeary, P.: Geometric Surface Inspection of Raw Milled Steel Blocks, pp. 849–856. Springer, Berlin (2004)
Pernkopf, F., O’Leary, P.: Visual inspection of machined metallic high-precision surfaces. EURASIP Journal on Applied Signal Processing archive 2002(1), 667–678 (2002)
Aceris-3D: FC Substrate Bump Inspection System. Product documentation, Aceris 3D Clark Graham 300, Baie D’Urfe, Québec, Canada (2005)
Comet-AG: Feinfocus Fox, High Resolution 2D/3D. Product documentation, Comet AG Herrengasse 10, 31775 Flamatt, Switzerland (2005)
Caulier, Y., Spinnler, K., Bourennane, S., Wittenberg, T.: New Structured Illumination Technique for the Inspection of High Reflective Surfaces. EURASIP Journal on Image and Video Processing (2008) doi:10.1155/2008/237459
Kammel, K.: Deflektometrische Untersuchung spiegelnd reflektierender Freiformflächen. University of Karlsruhe (TH), Germany (2004)
Takeda, M., Ina, H., Kobayashi, S.: Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry. J. Opt. Soc. Am. 72(1), 156–160 (1982)
Qian, K., Seah, H.S., Asundi, A.: Fault detection by interferometric fringe pattern analysis using windowed Fourier transform. Measurement Science and Technology 15, 1582–1587 (2005)
Krüger, S., Wernicke, G., Osten, W., Kayser, D., Demoli, N., Gruber, H.: Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors. Machine Vision Application in Industrial Inspection 3966(1), 145–153 (2000)
Li, X.: Wavelet transform for detection of partial fringe patterns induced by defects in nondestructive testing of holographic interferometry and electronic speckle pattern interferometry. Journal of Optical Engineering 39(1), 2821–2827 (2000)
Tsai, D.M., Huang, T.Y.: Automated surface inspection for statistical textures. Image and Vision Computing 21(4), 307–323 (2003)
Qian, K., Seah, H.S., Asundi, A.: Fringe 2005: Fault detection from temporal unusualness in fringe patterns. Stutgart, Germany (2005)
Kunttu, I., Lepistö, L., Rauhamaa, J., Visa, A.: Fourier-Based Object Description in Defect Image Retrieval. Machine Vision Applications 17(4), 211–218 (2006)
Ünsalan, C.: Pattern Recognition Methods for Texture Analysis Case Study: Steel Surface Classification. University of Hacettepe, Turkey (1998)
Li, W.B., Cui, T.J., Yin, X., Qian, Z.G., Hong, W.: Fast algorithms for large-scale periodic structures using subentire domain basis functions. IEEE Trans. on antennas and propagation 53(3), 1154–1162 (2005)
Caulier, Y., Spinnler, K., Wittenberg, T., Bourennane, S.: Specific Features for the Analysis of Fringe Images. Journal of Optical Engineering 47(5) (2008)
Knauer, M.C., Kaminski, J., Haeusler, G.: Phase Measuring Deflectometry: a new approach to measure specular free-from surfaces. Optical Metrology in production Engineering 5457, 366–376 (2004)
Kammel, S., Puente, L.F.: Deflektometrie zur Qualitätsprüfung spiegelnd reflektierender Oberflächen. Technisches Messen 70, 193–198 (2003)
Oppenheim, A.V., Lim, J.S.: The importance of Phase in Signals. Proc. of the IEEE 69(5), 529–541 (1981)
Weska, J.S., Charles, R.D., Rozenfeld, A.: A Comparative Study of Texture Measures for Terrain Classification. IEEE Transaction s on Systems, Man, and Cybernetics 6(4), 269–285 (1976)
Tang, W.H., Goulermas, J.Y., Wu, Q.H., Richardson, Z.J., Fitch, J.: A Probabilistic Classifier for Transformer Dissolved Gas Analysis With a Particle Swarm Optimizer. IEEE Trans. on Power Delivery 23(2) (2008)
Ruiz, A., López-de-Teruel, P.E.: Nonlinear Kernel-Based Statistical Pattern Analysis. IEEE Trans. on Neural Networks 12(1) (2001)
Babich, G.A., Camps, O.I.: Weighted Parzen Windows for Pattern Classification. IEEE Trans. on Pattern Anal. and Machine Intell. 18(5) (1996)
Foresti, G.L., Micheloni, C.: Generalized Neural Trees for Pattern Classification. IEEE Trans. on Neural Networks 13(6) (2002)
Geva, S., Sitte, J.: Adaptative Nearest Neighbor Pattern Classification. IEEE Trans. on Neural Networks 2(2) (1991)
Goldstein, M.: k-Nearest Neighbor Classification. IEEE Trans. on Information Theory 18(5) (1972)
Witten, I.H., Eibe, F.: Data Mining. Elsevier, Oxford (2005)
Kohavi, R.: A Study of Cross-Validation and Bootstrap for Accuracy Estimation and Model Selection. In: Proc. of IJCAI, vol. 3, pp. 1137–1145 (1995)
Efron, B., Tibshirani, R.J.: An Introduction to the Bootstrap. Chapman and Hall, New York (1993)
Cover, T.M., Hart, P.E.: Nearest Neighbor Pattern Classification. IEEE Trans. on Information Theory 13(1), 21–27 (1967)
Gutierrez-Osuna, R.: Wrappers for feature Subset Selection. IEEE Sensors Journal 2(3), 273–324 (2003)
Kohavi, R., John, G.H.: A Review. Artificial Intelligence 2(3), 189–202 (2002)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2008 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Caulier, Y., Bourennane, S. (2008). Fourier-Based Inspection of Free-Form Reflective Surfaces. In: Blanc-Talon, J., Bourennane, S., Philips, W., Popescu, D., Scheunders, P. (eds) Advanced Concepts for Intelligent Vision Systems. ACIVS 2008. Lecture Notes in Computer Science, vol 5259. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-88458-3_12
Download citation
DOI: https://doi.org/10.1007/978-3-540-88458-3_12
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-88457-6
Online ISBN: 978-3-540-88458-3
eBook Packages: Computer ScienceComputer Science (R0)