Abstract
The multislice method of calculating electron microscope images of thicker specimen is applied to several different specimen. First, some simple examples are worked through to help understand how to use the method and then some more complicated specimens are investigated to illustrate the method.
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Keywords
- Silicon Nitride
- Gallium Arsenide
- Electron Energy Loss Spectroscopy
- Electron Wave Function
- Thermal Vibration
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© 2010 Springer Science+Business Media, LLC
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Kirkland, E.J. (2010). Multislice Applications and Examples. In: Advanced Computing in Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-6533-2_7
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DOI: https://doi.org/10.1007/978-1-4419-6533-2_7
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Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4419-6532-5
Online ISBN: 978-1-4419-6533-2
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