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Part of the book series: The Springer International Series in Engineering and Computer Science (SECS, volume 33)
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Table of contents (9 chapters)
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Bibliographic Information
Book Title: Yield Simulation for Integrated Circuits
Authors: Duncan Moore Henry Walker
Series Title: The Springer International Series in Engineering and Computer Science
DOI: https://doi.org/10.1007/978-1-4757-1931-4
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media Dordrecht 1987
Hardcover ISBN: 978-0-89838-244-0Published: 30 September 1987
Softcover ISBN: 978-1-4419-5201-1Published: 10 December 2010
eBook ISBN: 978-1-4757-1931-4Published: 17 April 2013
Series ISSN: 0893-3405
Edition Number: 1
Number of Pages: XII, 209
Topics: Computer-Aided Engineering (CAD, CAE) and Design, Electrical Engineering