Abstract
For an annular cathode in a coaxial diode it has been shown that the averaged electric field strength at the end face of the cathode, En, depends on the edge thickness h as
. It has been found that the field strength varies with distance from the edge approximately as
. The problem of the electric field strength at the edge of the cathode in a magnetically insulated coaxial diode has been solved for the case where the cathode emissivity is limited with the use of a model assuming a given internal resistance of the voltage source.
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 3, pp. 71–76, March, 2008.
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Belomyttsev, S.Y., Romanchenko, I.V. & Rostov, V.V. Electric field strength at and near the cathode edge in a magnetically insulated coaxial diode. Russ Phys J 51, 299–306 (2008). https://doi.org/10.1007/s11182-008-9052-z
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DOI: https://doi.org/10.1007/s11182-008-9052-z