Abstract
A new approach to the simultaneous measurement of refractive index and thickness based on the focus shifts of a convergent beam intercepted by a test plate is proposed. By using ray optics, a defined focus shift can be derived as a function of the refractive index and thickness as well as the angular position of the test plate with respect to the optical axis. From a pair of focus shifts obtained at two different angular positions, it is shown that the desired measurands can be simultaneously determined without prior knowledge of either parameter. A simulation result for the proposed concept based on graphically solving the equations of their respective focus shifts is presented.
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K. U. Hii: MSc. Thesis, Faculty of Science, University of Malaya, Kuala Lumpur (2011).
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Hii, K.U., Kwek, K.H. Simultaneous measurement of refractive index and thickness with a convergent beam. OPT REV 21, 705–708 (2014). https://doi.org/10.1007/s10043-014-0114-x
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DOI: https://doi.org/10.1007/s10043-014-0114-x