Abstract
Based on the Huygens–Fresnel diffraction integral method, we report a theoretical investigation on the closed-aperture Z-scan technique by using the flat-topped beam. The sensitivity of the flat-topped beam Z-scan technique, which can be enhanced with the increase of the flatness order N for the flat-topped beam, is greatly higher than of the Gaussian beam. Some salient characteristics of the flat-topped beam Z-scan traces are addressed. The flat-topped beam Z-scan technique for characterizing the instantaneous nonlinearity is also presented.
Article PDF
Similar content being viewed by others
Avoid common mistakes on your manuscript.
References
M. Sheik-Bahae, A.A. Said, E.W. Van Stryland, High-sensitivity, single-beam n 2 measurments. Opt. Lett. 14, 955–957 (1989)
S. Hughes, J.M. Burzler, Theory of Z-scan measurements using Gaussian–Bessel beams. Phys. Rev. A 56, R1103–R1106 (1997)
W. Zhao, P. Palffy-Muhoray, Z-scan technique using top-hat beams. Appl. Phys. Lett. 63, 1613–1615 (1993)
B. Gu, J. Yan, Q. Wang, J.L. He, H.T. Wang, Z-scan technique for charactering third-order optical nonlinearity by use of quasi-one-dimensional slit beams. J. Opt. Soc. Am. B 21, 968–972 (2004)
W.Y. Zhang, M.G. Kuzyk, Effect of a thin optical Kerr medium on a Laguerre–Gaussian beam. Appl. Phys. Lett. 89, 101103 (2006)
G.J. Lee, Z-scan method using the flat-topped beam and its application to the evaluation of the two-photon-absorbing material. Jpn. J. Appl. Phys. 42, 3419–3423 (2003)
M. Alavinejad, B. Ghafary, F.D. Kashani, Analysis of the propagation of flat-topped beam with various beam orders through turbulent atmosphere. Opt. Laser Eng. 46, 1–5 (2008)
C. Xie, R. Gupta, H. Metcalf, Beam profile flattener for Gaussian beams. Opt. Lett. 18, 173–175 (1993)
W.B. Veldkamp, Laser beam profile shaping with interlaced binary diffraction gratings. Appl. Opt. 21, 3209–3212 (1982)
J.A. Hoffnagle, C.M. Jefferson, Design and performance of a refractive optical system that converts a Gaussian to a flattop beam. Appl. Opt. 39, 5488–5499 (2000)
S.D. Silvestri, V. Magni, O. Svelto, G. Valentini, Lasers with super-Gaussian mirrors. IEEE J. Quantum Electron. 26, 1500–1509 (1990)
F. Gori, Flattened Gaussian beams. Opt. Commun. 107, 335–341 (1994)
A.A. Tovar, Propagation of flat-topped multi-Gaussian laser beams. J. Opt. Soc. Am. A 18, 1897–1904 (2001)
Y.J. Li, Light beams with flat-topped profiles. Opt. Lett. 27, 1007–1009 (2002)
Y.J. Li, New expressions for flat-topped light beams. Opt. Commun. 206, 225–234 (2002)
J.D. Gaskill, Linear Systems Fourier Transforms and Optics (Wiley, New York, 1978)
R.E. Samad, N.D. Vieira, Analytical description of Z scan on-axis intensity based on the Huygens–Fresnel principle. J. Opt. Soc. Am. B 15, 2742–2747 (1998)
H.P. Li, B. Li, C.H. Kam, Y. L Lam, W.X. Que, L.M. Gan, C.H. Chew, G.Q. Xu, Femtosecond Z-scan investigation of nonlinear refraction in surface modified PbS nanoparticles. Opt. Mater. 14, 321–327 (2000)
M. Sheik-Bahae, A.A. Said, T.H. Wei, D.J. Hagan, E.W. Van Stryland, Sensitive measurement of optical nonlinearities using a single beam. IEEE J. Quantum Electron. 26, 760–769 (1990)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Wang, J., Gu, B., Xu, Y.M. et al. Enhanced sensitivity of Z-scan technique by use of flat-topped beam. Appl. Phys. B 95, 773–778 (2009). https://doi.org/10.1007/s00340-009-3547-3
Received:
Revised:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s00340-009-3547-3