Abstract
Various failure mechanisms within bismuth ruthernate resistor systems associated with firing, substrate, conductor termination, laser trimming, assembly, packaging, environmental testing, power loading and high voltages, respectively, are reviewed.
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Murthy, K.S.R.C., Kumar, A.V. Failure mechanisms in bismuth ruthenate resistor systems. J Mater Sci: Mater Electron 1, 61–71 (1990). https://doi.org/10.1007/BF00694908
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DOI: https://doi.org/10.1007/BF00694908