Abstract
An approach for the substantiated choice of the indexing procedure of a diffraction pattern is described. The technique is based on a combined use of powder X-ray diffraction data in Bragg–Brentano schemes and 2D GIXD of mainly oriented polycrystalline samples.
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Original Russian Text © 2017 A. S. Sukhikh, T. V. Basova, S. A. Gromilov.
Translated from Zhurnal Strukturnoi Khimii, Vol. 58, No. 5, pp. 992–1002, June–July, 2017.
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Sukhikh, A.S., Basova, T.V. & Gromilov, S.A. The use of 2D diffractometry data for oriented samples in the choice of a unit cell. J Struct Chem 58, 953–963 (2017). https://doi.org/10.1134/S0022476617050146
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DOI: https://doi.org/10.1134/S0022476617050146