Abstract
A novel compliant substrate, comprising mono-layers (PS1, PS2) and multi-layers (PSML1, PSML2) of porous silicon structures, fabricated using galvanostatic mode, was employed for the Molecular Beam Epitaxy (MBE) growth of 0.5 µm GaAs. To counteract the lattice parameter mismatch, the growth process was tailored with a buffer layer SiGe, a gradual Si1−xGex with and without an in-situ annealing. Our investigation primarily proposes a compliant substrate as a platform for GaAs growth, which can serve in photodiodes and lasers applications. Field-Emission Scanning Electron Microscopy (FE-SEM) and High-Resolution X-Ray Diffraction (HR-XRD) identified PS2 and PSML2 as potential candidates for further investigations. The Si1−xGex buffer layer has mitigated the formation of the 3D GaAs hillocks in PS2. Although, this approach has led to the formation of "lamellar twins" in PSML2, as a consequence of the substantial stress excreted by high porosity layers (HPLs) stack during the growth process. This strain was confirmed by the redshift of the GaAs Photoluminescence (PL) peak. Energy dispersive Spectroscopy (EDS) and X-ray Photoelectron spectroscopy (XPS) demonstrated that the GaAs layer was in its pure state. An in-situ annealing at 680 °C, resulted in a respective decrease in the full width at half maximum (FWHM) of the HR-XRD rucking curves (658.68 arc s).
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Acknowledgements
We gratefully thank Ahmed Benmanaa, Technical Support Manager at Laboservices, for his contributions in HR-XRD analysis. The authors would like to gratefully acknowledge the staff at the "Plateforme de Recherche en Sciences et Technologies PRST-UM" for their help and support with XPS analysis techniques. The authors would like to thank CAMPOS Andrea from "Centre Pluridisciplinaire de Microscopie Electronique et de Microanalyse (CP2M)" Marseille for EDS characterizations and technical help
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The authors confirm the contribution to the paper as follows: A. Saidi: Data collection, analysis, investigation, interpretation of results, writing, review and editing; I. Zeydi: Investigation, interpretation of results, manuscript preparation, writing, review and editing; M.H. Hadj Alouane: Investigation, writing; M. Bouabdellaoui: Investigation; L. Sfaxi: Validation, conceptualization; I. Berbezier: Resources; R. Mghaieth: Validation, conceptualization, supervision:
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Saidi, A., Zeydi, I., Alouane, M.H.H. et al. Tuning performance: strain modulation of GaAs layers grown on meso-porous silicon substrates. J Mater Sci: Mater Electron 35, 1149 (2024). https://doi.org/10.1007/s10854-024-12888-8
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DOI: https://doi.org/10.1007/s10854-024-12888-8