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10.1 Introduction

Thermoelectric (TE) materials can convert waste heat into electrical power, which is an effective way to reduce greenhouse gas emissions and contribute substantially to future power supply and sustainable energy management [16]. The main obstacle to the widespread use of TEs in diverse industries, e.g., for exhaust heat recovery in automobiles, is the low efficiency of materials in converting heat to electricity. The efficiency of a material used in TE devices is determined by the dimensionless figure of merit, ZT = S 2 −1 κ −1, where S is the Seebeck coefficient, T is the absolute temperature, ρ is the electrical resistivity, and κ is the total thermal conductivity (κ = κ lat + κ el, where κ lat and κ el are the lattice and electronic contributions, respectively). Since the S, ρ, and κ el in bulk materials are interrelated, it is very difficult to control them independently. Therefore, the reduction of κ lat is essential to enhancing ZT. The ZT value of the materials currently used in commercial cooling devices is still limited to about 1 or less over the entire operating temperature range, corresponding to a device efficiency of several percent. Recent improvements in TE materials have led to many advances, and enhanced ZT values have been reported for several classes of bulk materials, including filled skutterudites.

The name of skutterudite is derived from a naturally occurring mineral with CoAs3 structure, which was firstly discovered in Skutterud (Norway). The general formula of skutterudite compounds is MX 3, where M is one of the group 9 transition metals such as Co, Rh, or Ir and X is a pnictogen atom such as P, As, and Sb. These compounds are body-centered-cubic structure that contains 32 atoms in the unit cell with space group Im3. The most important point of the skutterudite structure is that there are two voids in the unit cell which can be filled by filler atoms with an ionic radius lower than the cage radius. This generates a so-called filled skutterudite with formula RM 4 X 12, where R is electropositive element like rare earth or alkaline earth. Figure 10.1 displays the filled skutterudite structure where the R, M, and X are shown in red, blue, and green spheres, respectively.

Fig. 10.1
figure 1

Filled-skutterudite structure of RM 4 X 12. R, M, and X are shown in red, blue, and green spheres, respectively

Early investigations on unfilled skutterudites dates back to the mid-1950s. Among skutterudites, CoSb3 has attracted the greatest interest in waste heat to electricity conversion applications due to its reasonable band gap of ~0.2 eV, high carrier mobility, and the fact that it is composed of inexpensive and environmentally benign constituent elements as compared to other skutterudites such as CoAs3. However, the κ lat of the pure binary CoSb3 is too high, which leads to low ZT and thus poor conversion efficiency for TE applications.

In 1977 La-filled [7] and in 1991 Ba-filled [8] skutterudites were synthesized. However, it has not become popular. In 1994, Slack [9] proposed the concept of “phonon–glass electron–crystal” (PGEC) as one of the desirable features a material should possess to maximize the ZT, in which a material conducts heat like a glass but behaves like a good crystal for the electronic properties. The typical example of the PGEC concept is filled skutterudites, such as CeFe4Sb12 [10]. Filled skutterudites realize the PGEC concept through the following strategies: a semiconductor-like behavior may lead to large S and low ρ; in addition, the loosely bound filler atoms in the skutterudite cages act as rattlers and thereby reduce the κ lat [11].

It has been reported that a large variety of guest atoms can be filled, such as rare earth elements [1216], alkaline earth elements [1719], alkali metals [20, 21], and others [2226]. The filling atoms are loosely bound to the other atoms in the intrinsic cages, leading to strong phonon scattering and significant reduction of the κ lat [27, 28]. In addition to the single-filled system, a double-filling approach has recently been attracting increasing attention. Introducing two filler types from different chemical groups into the cages of CoSb3 could introduce two distinctive filler vibrational frequencies for a broader range lattice phonon scattering, leading to a further reduction of κ lat [29, 30]. As the results, the maximum ZT values were improved to 1.3–1.4 in double-filled skutterudites as shown in Fig. 10.2 [12, 14, 1621, 3034].

Fig. 10.2
figure 2

Temperature dependence of dimensionless figure of merit, ZT of various filled-skutterudites reported so far; (a) single-filled system and (b) double-filled system

As described above, it has been widely reported that the voids in CoSb3 can be fully or partially filled with a variety of different atoms. However, reports on the TE properties of skutterudites filled by group 13 elements, such as Ga, In, and Tl, have been limited. Here we review the TE properties of CoSb3-based skutterudites filled by group 13 elements, which are mainly obtained in our group. In particular, the TE properties of the single-filled system: Tl x Co4Sb12 and Ga x Co4Sb12 and the double-filled system: Tl0.1In x Co4Sb12 will be discussed.

10.2 Thermoelectric Properties of Tl-filled skutterudite: Tl x Co4Sb12 [26]

Among CoSb3-based skutterudites filled by group 13 elements, the authors have focused on Tl-filled skutterudites: Tl x Co4Sb12, because of the following reasons. First, the electronegativity of Tl is close to that of Sb, which suggests that it may have a small effect on the electrical transport properties of CoSb3. Second, the radius of the void in a 12-coordinated site is close to the radius of Tl1+. Finally, Tl is heavier than other elements that have been recognized as compatible R atoms in RCo4Sb12. However, there is only one report [22], of Tl-filled skutterudites in which the TE properties below room temperature have been systematically investigated. In addition, in [22], it has been reported that Tl-filled skutterudites readily formed and up to around 22 % of the voids in CoSb3 could be filled with Tl. Therefore, the authors prepared the polycrystalline samples of Tl x Co4Sb12 (x = 0, 0.05, 0.10, 0.15, 0.20, and 0.25) and examined their high-temperature TE properties from room temperature to 750 K [26].

Figure 10.3 shows powder x-ray diffraction (XRD) patterns of the polycrystalline samples of Tl x Co4Sb12 (x = 0, 0.05, 0.10, 0.15, 0.20, and 0.25) prepared in our group, together with the peak positions calculated from the crystal structure of CoSb3. Basically, all samples are identified as skutterudite compounds, although they contain negligible amounts of CoSb2 as an impurity phase. The lattice parameters of Tl x Co4Sb12 increase almost linearly with the increase in the Tl content up to x = 0.20 and the lattice parameter of Tl0.25Co4Sb12 is almost identical with that of Tl0.20Co4Sb12, as shown in Fig. 10.4. Therefore, it can be concluded that the Tl-filling limit in CoSb3 is between 20 and 25 at.%, which is consistent with the literature data [22].

Fig. 10.3
figure 3

Powder XRD patterns of polycrystalline samples of Tl x Co4Sb12 (x = 0, 0.05, 0.10, 0.15, 0.20, and 0.25), together with the peak positions calculated from the crystal structure of CoSb3

Fig. 10.4
figure 4

Lattice parameters of polycrystalline samples of Tl x Co4Sb12 (x = 0, 0.05, 0.10, 0.15, 0.20, and 0.25)

Figure 10.5 shows the temperature dependence of (a) the electrical resistivity, ρ and (b) Seebeck coefficient, S for polycrystalline samples of Tl x Co4Sb12. The magnitude of ρ for CoSb3 is approximately 11 × 10−5 Ω m at 330 K and decreases with increasing temperature. On the other hand, the ρ values of Tl x Co4Sb12 are rather low (1–3 × 10−5 Ω m at 330 K) and indicate slight-positive temperature dependency. The magnitude of ρ for Tl x Co4Sb12 decreases with increase in the Tl content x. S for all samples is negative, which indicates that a majority of charge carriers are electrons. The absolute S of CoSb3 is 330 μV K−1 at 330 K and remains constant up to around 450 K, then decreases gradually with increasing temperature. The absolute S of Tl x Co4Sb12 decreases with increase in the Tl content x. The results for both ρ and S imply that Tl-filling leads to an increase of the electron carrier concentration. Room temperature values of Hall carrier concentration (n H) and Hall mobility (μ H) for Tl x Co4Sb12 are summarized in Table 10.1 and plotted in Fig. 10.6, as a function of the Tl content x. n H for Tl x Co4Sb12 increases with increasing Tl content, viz. n H for Tl0.25Co4Sb12 (23.9 × 10−19 cm−3) is more than ten times that of CoSb3 (1.56 × 10−19 cm−3). On the other hand, the Tl x Co4Sb12 samples exhibits similar μ H values at all Tl-filling contents. These results indicate that the Tl-filling increases the n H, but has no significant influence on μ H.

Fig. 10.5
figure 5

Temperature dependences of (a) the electrical resistivity, ρ and (b) the Seebeck coefficient, S of polycrystalline samples of Tl x Co4Sb12 (x = 0, 0.05, 0.10, 0.15, 0.20, and 0.25)

Table 10.1 Lattice parameter a, density d, Seebeck coefficient S (300 K), electrical resistivity ρ (300 K), Hall carrier concentration n H (300 K), Hall mobility μ H (300 K), average sound velocity v ave, Young’s modulus E, and Debye temperature θ D for polycrystalline samples of Tl x Co4Sb12 (x = 0, 0.05, 0.10, 0.15, 0.20, and 0.25)
Fig. 10.6
figure 6

The Hall carrier concentration, n H and Hall mobility, μ H at 300 K of polycrystalline samples of Tl x Co4Sb12, as a function of the Tl filling fraction, x

The thermal conductivity (κ) for Tl x Co4Sb12 are significantly reduced by Tl-filling, as shown in Fig. 10.7a. Tl0.25Co4Sb12 exhibits the lowest κ over the entire temperature range; at room temperature, κ for Tl0.25Co4Sb12 is 3.4 W m−1 K−1, which is less than half that of CoSb3. Figure 10.7b shows the temperature dependence of the lattice thermal conductivity (κ lat) for Tl x Co4Sb12. κ lat was obtained by subtracting the electronic thermal conductivity (κ el  = LσT, L = 2.45 × 10−8 W Ω K−2) from the total (measured) thermal conductivity κ. κ lat for Tl x Co4Sb12 significantly decreases with increase in the Tl content. However, as summarized in Table 10.1, the experimental results for average sound velocity (v ave), Young’s modulus (E), and Debye temperature (θ D) obtained from the sound velocity measurements are similar at all Tl-filling contents, despite κ lat being significantly reduced by Tl-filling. These results imply that Tl in CoSb3 has no direct effect on the strength of the interatomic bonding, but that Tl is weakly bonded with the other atoms, which results in a reduction of κ lat by rattling within the cage.

Fig. 10.7
figure 7

Temperature dependences of the thermal conductivity of polycrystalline samples of Tl x Co4Sb12 (x = 0, 0.05, 0.10, 0.15, 0.20, and 0.25); (a) total thermal conductivity, κ and (b) lattice thermal conductivity, κ lat

The low κ, compared with CoSb3, results in large TE figure of merit (ZT) for Tl-filled CoSb3, as shown in Fig. 10.8. In particular, Tl0.25Co4Sb12 exhibits the best ZT values; the maximum value of 0.90 is obtained at 600 K.

Fig. 10.8
figure 8

Temperature dependences of the dimensionless figure of merit, ZT of polycrystalline samples of Tl x Co4Sb12 (x = 0, 0.05, 0.10, 0.15, 0.20, and 0.25)

10.3 Thermoelectric Properties of Ga-Filled Skutterudite: Ga x Co4Sb12 [35]

There have been various reports on the TE properties of skutterudites filled by various elements, such as Ba-, K-, Na-, Ca-, Nd-, Sr-, Eu-, Yb-, In-, and Tl-filled skutterudites [12, 14, 1622, 26, 3638]. Although the TE properties of In-, and Tl-filled skutterudites have been investigated, the Ga-CoSb3 system has been scarcely investigated. Recently, Xiong et al. [39] has reported the TE properties of the Yb0.26Co4Sb12/yGaSb system, where only very small amount of Ga can fill into the crystal voids of CoSb3. Additionally, very recently, Qiu has reported that Ga atoms occupy both the void and Sb sites in CoSb3 and couple with each other and the ZT quickly increases to 0.7 at a Ga doping content as low as 0.1 per Co4Sb12 [40]. Here, the authors show the TE properties of polycrystalline samples of Ga x Co4Sb12 (x = 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30) in the temperature range from room temperature to 750 K, which are obtained in the author’s group [35].

The powder XRD patterns of the polycrystalline samples of Ga x Co4Sb12 (x = 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30) are shown in Fig. 10.9. All the peaks in the XRD patterns are identified as the peaks derived from the skutterudite phase. However, in the XRD patterns of the samples of x = 0.05, 0.10, and 0.15, negligible peaks of CoSb2 as the impurity phase can be observed. The lattice parameters calculated from the XRD patterns are plotted in Fig. 10.10, together with the data for Tl-filled CoSb3 [26]. The lattice parameters of the Ga-CoSb3 samples slightly increase with Ga-addition up to around x = 0.05, and after that keep a constant. In contrast, the lattice parameters of the Tl-CoSb3 samples increase almost linearly with increasing Tl-addition up to x = 0.20 and after that keep a constant. These results imply that Tl can be filled up to around x = 0.20 in Tl x Co4Sb12 but the maximum filling ratio of Ga in CoSb3 is lower than x = 0.05 in Ga x Co4Sb12. This result is well consistent with the other Ga-filled skutterudite reported by Xiong et al. [39], in which only very small amount of Ga can fill into the crystal voids of CoSb3. In addition, in [40], it has been reported that the maximum filling fraction of Ga in the voids of CoSb3 is around 8 %.

Fig. 10.9
figure 9

Powder XRD patterns of polycrystalline samples of Ga x Co4Sb12 (x = 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30), together with the peak positions calculated from the crystal structure of CoSb3

Fig. 10.10
figure 10

Lattice parameters of polycrystalline samples of Ga x Co4Sb12 (x = 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30), together with the data of polycrystalline samples of Tl x Co4Sb12

In order to confirm the filling limit of Ga into CoSb3, the field emission scanning electron microscopy (FE-SEM) and energy dispersive x-ray (EDX) analysis was performed on the surface of the hot-pressed samples. The XRD pattern, FE-SEM image, and EDX mapping images of Ga0.30Co4Sb12 are shown in Fig. 10.11. As shown in Fig. 10.11a, no peaks corresponding to GaSb are observed in the XRD pattern. Since the main peak position of Ga metal is close to a peak of CoSb3, it is unclear that whether Ga metal exists or not in the sample. On the other hand, as shown in Fig. 10.11b, the area that Ga concentrated in small pores is observed in the FE-SEM image and the EDX mapping images. Therefore, it can be concluded that most of Ga exists as metal state in the Ga0.30Co4Sb12 sample. This result is not consistent with the other Ga-filled skutterudite reported by Xiong et al. [39], in which some evidence of impurity phase of GaSb but not metallic Ga has been shown. At this point, the reason of the differences between our data and the literature data has not been clearly understood. From the quantitative EDX analysis, the amount of Ga in the matrix phase is confirmed to be approximately 0.1 at.%, i.e., x = ~0.02 in Ga x Co4Sb12. Therefore, it can be said that the maximum filling ratio of Ga into CoSb3 is x = 0.02 in Ga x Co4Sb12, and when exceeding the filling limit, Ga exists as metal state. This is clearly different from the cases of In- and Tl-filled CoSb3, in which both In and Tl can be filled up to approximately 0.05 < x < 0.1 in In x Co4Sb12 [41] and x = 0.2 in Tl x Co4Sb12 [26], respectively. The Ga metal may exist as liquid phase during high-temperature TE properties measurements.

Fig. 10.11
figure 11

(a) Powder XRD pattern of polycrystalline sample of Ga0.30Co4Sb12, together with the peak positions of Ga and GaSb. (b) SEM and EDX mapping images of polycrystalline sample of Ga0.30Co4Sb12

In order to verify the maximum filling limit of Ga and Tl into CoSb3, we performed low-temperature heat capacity analyses on the Co4Sb12, Ga0.2Co4Sb12, and Tl0.2Co4Sb12 samples. At low temperature (below 7 K), standard plots of C P /T versus T 2 was linear for Co4Sb12 sample and yielded Debye temperature of 306 K. This result is well consistent with the literature value (307 K for single crystals of Co4Sb12 reported by Caillat et al. [42]). The contribution of the filling atoms to the heat capacity would emerge as a form of excess heat capacity (ΔC). In the present case, we considered the following two values of ΔC: ΔC 1 = C of Ga0.2Co4Sb12 − C of Co4Sb12, and ΔC 2 = C of Tl0.2Co4Sb12 − C of Co4Sb12. Figures 10.12 and 10.13 plot ΔC 1 and ΔC 2 as a function of temperature, respectively. ΔC is well approximated by an Einstein contribution:

Fig. 10.12
figure 12

The difference in the heat capacities between Ga0.2Co4Sb12 and Co4Sb12, together with a line fitted by using the Einstein model

Fig. 10.13
figure 13

The difference in the heat capacities between Tl0.2Co4Sb12 and Co4Sb12, together with a line fitted by using the Einstein model

$$ \Delta C={C}_{\mathrm{E}}(T)=3 Ry{\left(\frac{\theta_{\mathrm{E}}}{T}\right)}^2\frac{\exp \left({\theta}_{\mathrm{E}}/T\right)}{{\left(\exp \left({\theta}_{\mathrm{E}}/T\right)-1\right)}^2}, $$
(10.1)

where R is the gas constant, y is the content of the filling atom in the formula of Ga y Co4Sb12 or Tl y Co4Sb12, and θ E is the Einstein temperature. Below 20 K, both ΔC 1 and ΔC 2 are well described by (10.1), in which we set two unknown parameters: y and θ E. In the case of ΔC 1, y and θ E were found to be 0.02 and 35 K, respectively. On the other hand, in the case of ΔC 2, y and θ E were found to be 0.15 and 56 K, respectively. Thus, it can be said that Ga or Tl can be filled up to y = 0.02 in Ga y Co4Sb12 and y = 0.15 in Tl y Co4Sb12, respectively. Note that the obtained Einstein temperature of 56 K is close to the value of 52 K estimated from the atomic displacement parameters for Tl0.22Co4Sb12 [22] indicating the substantial rattling of Tl in the skutterudite structure. Similarly, in the case of Ga-CoSb3 system, the maximum filling limit was calculated to be y = 0.02 in Ga y Co4Sb12, well consistent with the XRD and FE-SEM/EDX results as described above.

Temperature dependences of the electrical resistivity (ρ) and the Seebeck coefficient (S) of the polycrystalline samples of Ga x Co4Sb12 (x = 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30) are shown in Fig. 10.14a, b, respectively. The ρ of all the samples decrease with temperature, showing semiconductor behavior. By adding Ga to CoSb3, the ρ values increase with increasing x up to x = 0.15, and then decrease. The S values are negative for all the samples, indicating that the majority of charge carriers are electrons. The absolute S of all the samples are almost constant up to around 500 K, and decrease rapidly with increasing temperature, which is due to the thermal excitation of the charge carriers. At around room temperature, all the samples show the similar S values. However, at high temperatures, the absolute S decrease with increasing x in Ga x Co4Sb12 up to x = 0.15, and then increase. As summarized in Table 10.2, the n H slightly increases with increasing the amount of Ga, while the μ H decreases, which is due to the combination of the Ga-filling into the voids in the CoSb3 crystal and precipitation of Ga metal. In contrast to the Tl-filled CoSb3, the n H of the Ga-added CoSb3 is not sufficiently increased because only a few Ga is filled into CoSb3. The n H of Tl0.25Co4Sb12 is 23.90 × 1019 cm−3 [26], which is almost ten times larger than that of Ga0.25Co4Sb12 (3.42 × 1019 cm−3).

Fig. 10.14
figure 14

Temperature dependences of (a) the electrical resistivity, ρ and (b) the Seebeck coefficient, S of polycrystalline samples of Ga x Co4Sb12 (x = 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30)

Table 10.2 Lattice parameter a, sample bulk density d, Hall carrier concentration n H (300 K), and Hall mobility μ H (300 K) for polycrystalline samples of Ga x Co4Sb12 (x = 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30)

Temperature dependences of the κ and the κ lat for polycrystalline samples of Ga x Co4Sb12 (x = 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30) are shown in Fig. 10.15a, b, respectively. The κ decreases with increasing temperature first and then increases from around 550 K. This temperature dependence can be attributed to a bipolar conduction in semiconductors. The κ lat of Ga x Co4Sb12 drastically decreases with Ga-addition. Ga0.25Co4Sb12 exhibits the lowest κ lat (3.52 W m−1 K−1 at 500 K). These results imply that not only the filled Ga but also the precipitated Ga lead to the effective reduction of κ lat.

Fig. 10.15
figure 15

Temperature dependences of the thermal conductivity of polycrystalline samples of Ga x Co4Sb12 (x = 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30); (a) total thermal conductivity, κ and (b) lattice thermal conductivity, κ lat

Temperature dependence of the ZT for polycrystalline samples of Ga x Co4Sb12 (x = 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30) is shown in Fig. 10.16. Although Ga can be filled only up to x = ~0.02 in Ga x Co4Sb12, significant reduction of κ lat is achieved, leading to enhancement of ZT. In particular, Ga0.25Co4Sb12 exhibits the maximum ZT value of 0.18 at around 500 K. This value is lower than those of In- and Tl-filled skutterudites [22, 26, 37, 38]. This low ZT of the Ga-CoSb3 system is likely due to the unoptimized carrier concentration. In case of the Tl-CoSb3 system, the Tl-filling into CoSb3 increases carrier concentration [26]. However, in case of the Ga-CoSb3 system, the carriers are not sufficiently doped because only a few Ga is filled into CoSb3. Nonetheless, since Ga-adding to CoSb3 is effective method for reduction of κ lat.

Fig. 10.16
figure 16

Temperature dependences of the dimensionless figure of merit, ZT of polycrystalline samples of Ga x Co4Sb12 (x = 0.05, 0.10, 0.15, 0.20, 0.25, and 0.30)

10.4 Thermoelectric Properties of Tl- and In Double-Filled Skutterudite: Tl0.1In x Co4Sb12 [43]

Skutterudites filled by group 13 elements, of Ga-, In-, and Tl-filled systems, have attracted much attention recently as high-performance TE materials. Among the compounds in the Tl-filled system, our group has examined the high-temperature TE properties of Tl y Co4Sb12 and obtained a maximum ZT of 0.90 at 600 K for Tl0.25Co4Sb12 [26]. The maximum ZT values for In- and Tl-filled skutterudites have been obtained at the compositions of the maximum filling limit [26, 37]. Thus, the enhancement of the ZT of these filled skutterudites is restricted by the filling limit of atoms into the voids of the skutterudite structure. In the case of In-filled skutterudites, there are a few reports in which In naturally forms nano-sized InSb inclusions when it exceeds the filling limit, and these nano-inclusions appear to play an important role in significantly reducing κ lat [34, 44]. However, there have been a number of reports where no such nano-inclusions were observed in the same In-filled system [38, 45]. Thus, it remains unclear whether any nanostructures form in In-filled skutterudites.

Here, we review the results on the dramatically reduced κ lat, and thus enhanced ZT, for CoSb3-based skutterudites by a combined approach of double filling of group 13 elements (Tl and In) and self-forming of nanostructures [43].

In the XRD patterns of polycrystalline samples of Tl0.1In x Co4Sb12 (x = 0.1, 0.2, and 0.3), all the peaks indicate a skutterudite structure with the space group Im3, and there are no notable peaks corresponding to impurities as shown in Fig. 10.17. The XRD patterns confirm that all samples have nearly the same lattice parameter values, as summarized in Table 10.3. According to Vegard’s rule, under the assumption that Tl is fully filled while In is partly filled, the lattice parameter a of Tl0.1In x Co4Sb12 can be written as:

Fig. 10.17
figure 17

Powder XRD patterns of polycrystalline samples of Tl0.1In x Co4Sb12 (x = 0.15, 0.20, 0.25, and 0.30), together with the peak positions calculated from the crystal structure of CoSb3

Table 10.3 Lattice parameter a, sample bulk density d, Hall carrier concentration n H (300 K), and Hall mobility μ H (300 K) for polycrystalline samples of Tl0.1In x Co4Sb12 (x = 0.15, 0.20, 0.25, and 0.30)
$$ a\kern0.5em \mathrm{of}\ {\mathrm{Tl}}_{0.1}{\mathrm{In}}_x{\mathrm{Co}}_4{\mathrm{Sb}}_{12}=a\kern0.5em \mathrm{of}\ {\mathrm{Co}}_4{\mathrm{Sb}}_{12}+\Delta {a}_1+\Delta {a}_2, $$
(10.2)

where a of Co4Sb12 is 0.9034 nm [26], Δa 1 = a of Tl0.1Co4Sb12 − a of Co4Sb12, and Δa 2 = a of In x Co4Sb12 − a of Co4Sb12. The values of Δa 1 and Δa 2 can be calculated from the changes in the lattice parameters of Tl- and In-filled CoSb3 using the filling ratio obtained by the present authors’ group. By fitting the calculated lattice parameter to the experimental one, we obtained x = 0.09. This indicates that the maximum filling limits of Tl and In in Tl0.1In x Co4Sb12 are 0.1 and 0.09, respectively. Therefore, it is believed that a secondary phase composed mainly of In may exist in addition to the skutterudite phase after exceeding the maximum filling limit of In.

The FE-SEM and EDX mapping images of the hot-pressed Tl0.1In0.3Co4Sb12 sample are shown in Fig. 10.18. In these images, an In-rich region can be clearly observed mainly at the grain boundaries, implying that In added after exceeding the maximum filling limit precipitates as a secondary phase. Since the particle size of the secondary phase is too small, the peaks of this impurity phase cannot be observed in the XRD patterns.

Fig. 10.18
figure 18

FE-SEM and EDX mapping images of the polycrystalline sample of Tl0.1In0.3Co4Sb12

In order to identify the chemical state of the In-based secondary phase, we performed transmission electron microscopy (TEM) and X-ray absorption fine structure (XAFS) analyses on the Tl0.1In0.3Co4Sb12 sample. TEM image taken from a single grain of a sintered pellet of Tl0.1In0.3Co4Sb12 is shown in Fig. 10.19a. Nanoparticles (<50 nm) can be clearly observed. They have mostly formed along the grain boundaries. It is thought that they are composed mainly of In present in excess of its filling limit. The nanoparticles were analyzed by electron diffraction techniques. The electron diffraction patterns obtained are shown in Fig. 10.19b, c. The incident beam was focused to a diameter of ~10 nm. The electron diffraction patterns are entirely consistent with In2O3 (space group: Ia-3) viewed along the [110] and [112] directions.

Fig. 10.19
figure 19

(a) TEM image taken from a single grain of the sintered pellet of Tl0.1In0.3Co4Sb12; (b) and (c) electron diffraction patterns obtained with the electron beam aligned along the [110] and [112] directions, respectively; (d) comparison of the measured In L3-edge normalized spectra of a Tl0.1In0.3Co4Sb12 bulk sample with the reference In metal and In2O3 powder

To identify the chemical state of In within the sample, In L 3-edge x-ray absorption near edge structure (XANES) measurements were performed on a Tl0.1In0.3Co4Sb12 bulk sample at the Synchrotron Light Research Institute, Thailand. Figure 10.19d compares the measured In L 3-edge spectra of this Tl0.1In0.3Co4Sb12 bulk sample and the reference In metal and In2O3 powder. Clearly, all the features of the XANES In L 3-edge spectrum of the Tl0.1In0.3Co4Sb12 bulk sample agree very well with those of the reference In2O3 powder. This indicates that the In added in excess of the filling limit within the sample is in the form of In2O3. Thus, the XANES measurements confirm that the Tl0.1In0.3Co4Sb12 sample contains In2O3.

Temperature dependences of the electrical resistivity (ρ) and the Seebeck coefficient (S) of the polycrystalline samples of Tl0.1In x Co4Sb12 (x = 0.15, 0.20, 0.25, and 0.30) are shown in Fig. 10.20a, b, respectively. The ρ of all the samples decrease dramatically with In-addition. By adding Tl and In to CoSb3, the ρ values of all the samples are below 1.25 × 10−5 Ω m at room temperature and increase with elevated temperature, typical of heavily doped semiconductors. The Tl0.1In0.3Co4Sb12 sample exhibits the lowest ρ value, 7.5 × 10−6 Ω m at room temperature. The S values are negative for all the samples, indicating that the majority of charge carriers are electrons. The absolute S of all the samples increases up to around 700 K, and decreases with increasing temperature. As summarized in Table 10.3, there is a large increase in n H, while μ H shows a minimal increase with increasing total filling fraction, which means that Tl/In addition leads to a net increase in conduction electrons but has no significant influence on the scattering of carriers. As shown in Fig. 10.21, all the samples show the constant and large values of the power factor (S 2 ρ −1) in the whole temperature range investigated in the present study. The Tl0.1In0.3Co4Sb12 sample exhibits the highest power factor, around 5.0 mW m−1 K−2 in relatively wide temperature range from 600 to 750 K.

Fig. 10.20
figure 20

Temperature dependences of (a) the electrical resistivity, ρ and (b) the Seebeck coefficient, S of polycrystalline samples of Tl0.1In x Co4Sb12 (x = 0.15, 0.20, 0.25, and 0.30)

Fig. 10.21
figure 21

Temperature dependences of the power factor, S 2 ρ −1 of polycrystalline samples of Tl0.1Tl x Co4Sb12 (x = 0.15, 0.20, 0.25, and 0.30)

Temperature dependences of the κ and the κ lat for polycrystalline samples of Tl0.1In x Co4Sb12 (x = 0.15, 0.20, 0.25, and 0.30) are shown in Fig. 10.22a, b, respectively. The κ decreases with increasing temperature first and then increases from around 600 to 700 K. This temperature dependence can be attributed to a bipolar conduction in semiconductors. The κ lat of Tl0.1In x Co4Sb12 drastically decreases with In-addition due to the phonon scattering by Tl- and In-rattling and nano-sized In2O3 precipitated at grain boundaries.

Fig. 10.22
figure 22

Temperature dependences of the thermal conductivity of polycrystalline samples of Tl0.1In x Co4Sb12 (x = 0.15, 0.20, 0.25, and 0.30); (a) total thermal conductivity, κ and (b) lattice thermal conductivity, κ lat

The temperature dependences of the κ lat of polycrystalline samples of CoSb3, Tl0.1Co4Sb12, Tl0.1In0.1Co4Sb12, and Tl0.1In0.3Co4Sb12 are shown in Fig. 10.23. A comparison between the κ lat values of CoSb3 and Tl0.1Co4Sb12 reveals a significant reduction of κ lat. This is due to the effective phonon scattering by the rattling of Tl. Moreover, filling with In in addition to Tl yields a further reduction of κ lat in the Tl0.1In0.1Co4Sb12 sample, suggesting that the double-filling approach is effective for phonon scattering, and hence in reducing κ lat. Furthermore, it can be confirmed that the κ lat of the Tl0.1In0.3Co4Sb12 sample is much lower than those of the other samples. This implies that the rattling of Tl/In, as well as the In2O3 nanoparticles formed at the grain boundaries, scatter heat-carrying phonons, leading to the dramatic reduction of κ lat. Owing to the very low κ lat, the Tl0.1In0.3Co4Sb12 sample exhibits an excellent ZT; its maximum value is 1.20 at around 700 K, as shown in Fig. 10.24.

Fig. 10.23
figure 23

Temperature dependences of the dimensionless figure of merit, ZT of polycrystalline samples of Tl0.1In x Co4Sb12 (x = 0.15, 0.20, 0.25, and 0.30)

Fig. 10.24
figure 24

Temperature dependence of the lattice thermal conductivity, κ lat of polycrystalline samples of CoSb3, Tl0.1Co4Sb12, Tl0.1In0.1Co4Sb12, and Tl0.1In0.3Co4Sb12. The numbers 1, 2, and 3 in the figure represent phonon scattering by Tl-rattling, Tl- and In-rattling, and Tl- and In-rattling plus In2O3 nanoparticles, respectively

We can conclude that the Tl/In-double-filled skutterudite exhibits the excellent TE properties. Tl and In are filled up to x = ~0.09 in Tl0.1Tl x Co4Sb12 when exceeding the filling limit, In existed as nano-sized In2O3 (<50 nm) at grain boundaries. By investigating the TE properties of Tl- and In-double-filled CoSb3-based skutterudites, we demonstrate that the reduction of κ lat is due to the effective phonon scattering induced both by the rattling of Tl and In and by the naturally formed In2O3 nanoparticles (<50 nm). This yields a dramatic enhancement of ZT to be 1.20 at 700 K. The combined approach of double filling and self-formed nanostructures might be applicable to various clathrate compounds. Thus, these results point to a new strategy in the improvement of bulk TE materials.

10.5 Summary

In this chapter, we reviewed the TE properties of CoSb3-based skutterudites filled by group 13 elements, i.e., the systems of Tl x Co4Sb12, Ga x Co4Sb12, and Tl0.1In x Co4Sb12. The temperature dependence of ZT of the best materials in the individual system is summarized in Fig. 10.25.

Fig. 10.25
figure 25

The dimensionless figure of merit, ZT of polycrystalline samples of Tl0.25Co4Sb12, Ga0.25Co4Sb12, and Tl0.1In0.3Co4Sb12

Tl can be filled in CoSb3 up to around x = 0.2 in Tl x Co4Sb12. Since the valence state of Tl in CoSb3 can be considered to be Tl1+, the Tl-filling yields net increase in electron carriers. Therefore, the carrier concentration of CoSb3 can be controlled by Tl-filling. On the other hand, Tl filled in CoSb3 can act as rattlers and scatter heat carrying phonons efficiently. Therefore, Tl-filled CoSb3 exhibits low κ lat with optimized carrier concentration, and hence high ZT value; the maximum ZT value is 0.90 at 600 K obtained for Tl0.25Co4Sb12.

In contrast to Tl-filled CoSb3, Ga can be filled in CoSb3 up to only x = 0.02 in Ga x Co4Sb12, and when exceeding the filling limit, Ga exists as metal states mainly at grain boundaries in the polycrystalline samples of Ga x Co4Sb12. Due to this low filling limit of Ga in CoSb3, carriers are not sufficiently doped by Ga-filling. Nonetheless, not only very small amount of filled Ga but also precipitated Ga metals may scatter heat carrying phonons, leading to the reduction of κ lat. Mainly due to the reduced κ lat, the ZT is slightly enhanced by Ga-adding to CoSb3; the maximum ZT value is 0.18 at 500 K obtained for Ga0.25Co4Sb12.

In case of the double-filling system, i.e., Tl0.1In x Co4Sb12, all Tl is filled but In can be filled up to around x = 0.09 in Tl0.1In x Co4Sb12. In added in excess of the filling limit within the samples is in the form of In2O3 which is naturally formed as nanoparticles (<50 nm) mainly at the grain boundaries of the polycrystalline samples. Effective phonon scattering occurred both by the rattling of Tl and In and by the naturally formed In2O3 nanoparticles yield significant reduction of κ lat and thereby dramatic enhancement of ZT. Tl0.1In0.3Co4Sb12 exhibits the maximum ZT of 1.20 at around 700 K, which is very high for bulk materials.

We consider the following two studies are important in this research for future. The first one is further enhancement of ZT by nanostructuring. Recently, various nanocrystalline bulk materials have been prepared by ball-milling followed by hot-pressing or spark plasma sintering and the enhancement of ZT have been achieved [46, 47]. The method is considered to be applied to the CoSb3-based skutterudites. The second one is to develop p-type CoSb3-based skutterudites filled by group 13 elements. Although the CoSb3-based skutterudites filled by group 13 elements reported here have high ZT values, all the samples are n-type, i.e., they indicate negative S values. However, for a powerful TE module, the similar performances in both n-type and p-type TE materials is required. Therefore, the p-type CoSb3-based skutterudites filled by group 13 elements should be developed. Very recently, our group has demonstrated that TlxFeyCo1−y Sb12 exhibit p-type characteristics and relatively high ZT values. The details of the results will be reported in near future.