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Material characterization technique which uses a tip (typically silicon) on the end of a cantilever to determine the surface profile of a material. As the cantilever is moved across the surface, a laser is reflected off of the backside. As the cantilever is deflected, the change in laser beam position is detected by a photodetector. This information is then used to create a three-dimensional image of the surface, with atomic-scale resolution.
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© 2008 Springer-Verlag
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(2008). Atomic Force Microscope (AFM). In: Li, D. (eds) Encyclopedia of Microfluidics and Nanofluidics. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-48998-8_59
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DOI: https://doi.org/10.1007/978-0-387-48998-8_59
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-387-32468-5
Online ISBN: 978-0-387-48998-8
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