HREM analysis of structure and defects in a Σ5 (210) grain boundary in rutile U. DahmenS. PaciornikJ. B. Vandersande OriginalPaper Pages: 125 - 136
Mechanical properties of twist grain boundaries in Cu Miki NomuraJames B. Adams OriginalPaper Pages: 137 - 146
Effect of curvature on interfacial segregation: Electronic contribution to the point defect/interface binding energy P. A. DeymierJ. O. Vasseur OriginalPaper Pages: 147 - 152
Grain boundary misorientation changes during grain growth in pure aluminium L. S. ShvindlermanV. G. SursaevaR. G. Faulkner OriginalPaper Pages: 153 - 168
Epitaxial growth defects and interfacial structures of Cu deposited on TiO2 P. LuF. Cosandey OriginalPaper Pages: 169 - 181
Grain growth controlled by triple junctions: Effect of number of topological elements M. A. Fortes OriginalPaper Pages: 183 - 191