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Two-step preparation and characterization of ZnO Core–Si shell coaxial nanorods

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Journal of Theoretical and Applied Physics

Abstract

This study compares and analyzes the key characteristics of the ZnO core–Si shell coaxial nanorod (Si@ZnO NR) heterostructures that were grown on semi-insulating, (100)-oriented Si substrates at Si layer temperatures of 450, 500, 550 and 600 °C for optoelectronic device applications. The Si@ZnO NRs were prepared in two separate stages. Vapor-phase transport produced the ZnO NRs, whereas rapid thermal chemical vapor deposition formed the Si layers. Results obtained from X-ray diffraction, field emission scanning electron microscopy, energy-dispersive X-ray spectroscopy and Raman tests indicate that the ZnO NRs were single crystals with a zincblende configuration. The findings also reveal that the Si layer was polycrystalline in nature, poly-Si, with a würtzite configuration. The present research is beneficial to the optoelectronic devices such as light-emitting diodes, solar cells and photodetectors in the UV–infrared range using the Si@ZnO coaxial nanostructures.

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Acknowledgments

This research was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) grant funded by the Ministry of Education, Science and Technology (MEST) (NRF-2016R1D1A1B03930992), (NRF-2016R1A6A1A03012877).

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  1. Quantum Functional Semiconductor Research Center, Dongguk University, Seoul, 100-715, South Korea

    Im Taek Yoon & Hak Dong Cho

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  1. Im Taek Yoon
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Correspondence to Im Taek Yoon.

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Yoon, I.T., Cho, H.D. Two-step preparation and characterization of ZnO Core–Si shell coaxial nanorods. J Theor Appl Phys 14 (Suppl 1), 9–16 (2020). https://doi.org/10.1007/s40094-020-00398-x

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  • DOI: https://doi.org/10.1007/s40094-020-00398-x

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