Abstract
The interfacial interaction between the Sn-8.55Zn-0.5Ag-0.5Ga-0.1Al solder and three kinds of metallized substrates (Cu, Cu/Au, and Cu/Ni-P/Au) does not form the Cu-Sn intermetallic compound (IMC). Continuous Cu-Zn and discontinuous Ag-Zn interfacial IMC layers formed between the Cu and Sn-Zn-Ag-Ga-Al solder, while Cu-Zn and Au-Al-Zn IMCs formed on the Cu/Au substrate. Only the Au-Al-Zn IMC formed at the interface when the electroless Ni-P deposit was the diffusion barrier between Cu and the Au surface layer.
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Chuang, CM., Hung, HT., Liu, PC. et al. The interfacial reaction between Sn-Zn-Ag-Ga-Al solders and metallized Cu substrates. J. Electron. Mater. 33, 7–13 (2004). https://doi.org/10.1007/s11664-004-0287-3
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DOI: https://doi.org/10.1007/s11664-004-0287-3