Abstract
Low-cycle, lap-shear fatigue behavior of Sn-based, Pb-free solder alloys, Sn-3.5Ag, Sn-3.5Ag-Cu, Sn-3.5Ag-Bi, and Sn-0.7Cu, were studied at room temperature using specimens with printed circuit board (PCB)/solder/PCB structure under total displacement of ±10 µm, 12 µm, 15 µm, and 20 µm. The fatigue lives of various solder joint materials, defined as 50% load drop, were correlated with the fracture paths and analyzed using the Coffin-Manson relation, Morrow’s plastic-energy dissipation model, and Solomon’s load-drop parameter. The Sn-3.5Ag, Sn-0.7Cu eutectics, and Sn-3.5Ag-Cu ternary alloys showed the same level of fatigue resistance, while Bi-containing alloys showed substantially worse fatigue properties. Cross-sectional fractography revealed cracks initiated at the solder wedge near the solder mask and subsequently propagated into the solder matrix in the former group of alloys, in contrast with the crack propagation along the solder/under bump metallurgy (UBM) interfaces in the Sn-3.5Ag-Bi alloys. Inferior fatigue resistance of Bi-containing alloys was ascribed to high matrix hardness, high stiffness, possible Bi segregation to the interface, and high residual stress in the interfacial area.
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References
H.J. Frost and M.F. Ashby, Deformation-Mechanism Maps: the Plasticity and Creep of Metals and Ceramics (New York: Pergamon Press, 1982), pp. 6–16.
Y. Kariya and M. Otsuka, J. Electron. Mater. 27, 1229 (1998).
C. Kanchanomai, Y. Miyahita, and Y. Mutoh, Int. J. Fatigue 24, 671 (2002).
J. Liang, N. Gollhardt, P.S. Lee, S.A. Schrodeder, and W.L. Morris, Fatigue Fract. Eng., Mater. Struct. 19, 1401 (1996).
C. Kanchanomai, S. Yamamoto, Y. Miyahsita, Y. Mutoh, and A.J. Mcevily, Int. J. Fatigue 24, 57 (2002).
S. Wen, L.M. Keer, and H. Mavoori, J. Electron. Mater. 30, 1190 (2001).
J. Zhao, Y. Mutoh, Y. Miyashita, and S.L. Mannan, J. Electron. Mater. 31, 879 (2002).
H.G. Song, J.W. Morris, Jr., and F. Hua, JOM 54, 30 (2002).
D.K. Joo, S.W. Shin, K.O. Lee, and J. Yu, 52nd Electronic Components Technology Conf. (Piscataway, NJ: IEEE, 2002), pp. 1221–1225.
S.K. Kang, W.K. Choi, D.Y. Shin, P. Lauro, D.W. Henderson, T. Gosselin, and D.N. Leonard, 52nd Electronic Components Technology Conf. (Piscataway, NJ: IEEE, 2002), pp. 146–153.
T.S. Park and S.B. Lee, 52nd Electronic Components Technology Conf. (Piscataway, NJ: IEEE, 2002), pp. 979–984.
J.K. Lin, A.D. Silva, D. Frear, Y. Guo, J.W. Jang, L. Li, D. Mitchell, B. Yeung, and C. Zhang, 51st Electronic Components Technology Conf. (Piscataway, NJ: IEEE, 2001), pp. 455–462.
E.A. Brandes, Smithells Metals Reference Book (London: Butterworths, 1983), pp. 11–211.
J.W. Jang, D.R. Frear, T.Y. Lee, and K.N. Tu, J. Appl. Phys. 88, 6359 (2000).
J.Y. Song and J. Yu, Thin Solid Films 415, 167 (2002).
S.W. Shin, K.O. Lee, and J.Yu (Paper presented at the 2003 TMS Annual Meeting, San Diego, CA, 2–6 March 2003).
H.D. Solomon and E.D. Tolksdorf: J. Electron. Packaging 118, 67 (1996).
X.Q. Shi, H.L.J. Pang, W. Zhou, and Z.P. Wang, Scripta Mater. 41, 289 (1999).
H.D. Solomon, J. Electron. Packaging Trans. ASME 113, 102 (1991).
S. Choi, K.N. Subramanian, J.P. Lucas, and T.R. Bieler, J. Electron. Mater. 29, 1249 (2000).
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Lee, K.O., Yu, J., Park, T.S. et al. Low-cycle fatigue characteristics of Sn-based solder joints. J. Electron. Mater. 33, 249–257 (2004). https://doi.org/10.1007/s11664-004-0130-x
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DOI: https://doi.org/10.1007/s11664-004-0130-x