Abstract:
We study the wetting behaviour of thin polystyrene (PS) films on regularly corrugated silicon substrates. Below a critical film thickness the PS films are unstable and dewet the substrates. The dewetting process leads to the formation of nanoscopic PS channels filling the grooves of the corrugated substrates. Films thicker than the critical thickness appear stable and follow the underlying corrugation pattern. The critical thickness is found to scale with the radius of gyration of the unperturbed polymer chains.
Article PDF
Similar content being viewed by others
Explore related subjects
Discover the latest articles, news and stories from top researchers in related subjects.Avoid common mistakes on your manuscript.
Author information
Authors and Affiliations
Additional information
Received 6 April 2000 and Received in final form 24 August 2000
Rights and permissions
About this article
Cite this article
Rehse, N., Wang, C., Hund, M. et al. Stability of thin polymer films on a corrugated substrate. Eur. Phys. J. E 4, 69–76 (2001). https://doi.org/10.1007/s101890170144
Issue Date:
DOI: https://doi.org/10.1007/s101890170144