Abstract.
We report a simplified Z-scan technique based on a study on the symmetric features of a typical Z-scan curve. The contributions from the two-photon absorption (TPA) and the nonlinear refraction (NLR) are easily separated from a closed-aperture Z-scan curve using this method. And the determination of the two nonlinearities is simplified and unambiguous. We demonstrate this method on ZnSe, CdS, and ZnTe semiconductors with 120-fs laser pulses. And the influence from the uncertainty of the focal plane (Z=0) position is discussed. It is also found that the TPA coefficient can be obtained independently without knowing the exact location of the focal point.
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Received: 8 July 1999 / Published online: 3 November 1999
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Yin, M., Li, H., Tang, S. et al. Determination of nonlinear absorption and refraction by single Z-scan method. Appl Phys B 70, 587–591 (2000). https://doi.org/10.1007/s003400050866
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DOI: https://doi.org/10.1007/s003400050866