Abstract
Wavelength-division multiplexing has become the dominant approach to utilizing the massive bandwidth of optical fibers and integrated optics, including those based on a photonic crystal approach and recent nanotechnology achievements. For tunable sources and tunable receivers, it is desirable to measure the wavelength accurately and quickly. Unfortunately, current wavelength-measurement devices are not integrated and not fast enough to support 1 Gbit/s and higher requirements of the modern communication lines. We show here how to make an integrated optical system that results in an intensity-independent wavelength determination and a wavelength-independent intensity determination at ultra-short pulse duration or higher than ∼1-GHz bandwidth. The two output beams from a Mach–Zehnder interferometer, tuned to 3 dB at each output at the beginning of the wavelength-measurement range, provide all of the needed information. We show how a simple fast wavelength meter can be built into a silicon – or other – optical chip. It employs fuzzy metrology using both outputs of an integrated interferometer.
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42.79.Sz; 42.87.Bg; 42.79.Ta
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Caulfield, H., Zavalin, A. A nano/micro ‘meso’ scale self-calibrating integrated optical wavelength and intensity meter. Appl. Phys. B 84, 275–279 (2006). https://doi.org/10.1007/s00340-006-2332-9
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DOI: https://doi.org/10.1007/s00340-006-2332-9