Abstract
The samples were introduced into the XRF spectrometer in ordinary flat bottom polyethylene bottles for the estimation of Zr or Hf in presence of one another in solution. By using high voltage (50 kV) and high current (50 mA) least limits of detection obtained were an order of magnitude better than other conventional analytical techniques. Relations of intensity to concentration in various concentration ranges have been determined and the results are compared with those of other analytical techniques.
Article PDF
Similar content being viewed by others
Avoid common mistakes on your manuscript.
References
J. L. SETSER, Determination of Zirconium and Hafnium in Meteorites, Sediments, and Terrestrial materials by neutron activation analysis, TID-19179, 1963.
R. C. WEAST, M. J. ASTLE, CRC Handbook of Chemistry and Physics, CRC Press, USA, 1979. B26.
M. TAKAHASHI, H. MIYAZAKI, Y. KATOH, Zirconium in Nuclear Industry, ASTM PCN D4-824000-35, USA, 1984, p. 46.
F. W. E. STRELOW, C. J. C. BOTHMA, Anal. Chem., 39 (1967) 595.
R. S. BABU, C. M. PAUL, K. R. RAMASUBRAMANIAN, R. B. SUBRAMANYAM, A. E. E. T-201, India, 1965, p. 11.
F. A. COTTON, G. WILKINSON, Advanced Inorganic Chemistry, A Comprehensive Text, John Wiley, New York, 1980, p. 824.
S. V. ELINSON, K. E. PETROV, Analytical Chemistry of Zirconium and Hafnium, (English translation from Russian by N. KANER), Monson S., Jerusalem, 1965.
A. K. MUKHERJI, Analytical Chemistry of Zirconium and Hafnium, Pergamon Press, Oxford, 1970.
D. COSTER, B. HEVESY, Nature, 111 (1923) 79.
V. V. SERBINOVICH, V. P. ANTONOVICH, N. A. PSHETAKOVSKAYA, J. Anal. Chem., USSR, 41 (1986) 867.
A. BROOKES, A. TOWNSHEND, Analyst, 95 (1970) 529.
F. L. CHAN, Advances in X-Ray Analysis, Vol., 15, Plenum Press, New York, 1972, p. 209.
T. G. DZUBAY, X-Ray Fluorescence Analysis of Environmental Samples, Ann Arbor Science, Michigan, 1978, p. 62.
J. V. GILFRICH, L. S. BIRKS, Anal. Chem., 56 (1984) 77.
R. PLESCH, Siemens Application Note No. 157, A Correction Program for X-ray Spectrometry, Ord. No. E632/087.101, Karlsruhe, FRG.
E. P. BERTIN, Principles and Practice of X-Ray Spectrometric Analysis, Plenum Press, New York, 1978.
R. PLESCH, B. THIELE, Siemens Application Note No. 196, Fundamentals of the Siemens Computer Progams for X-Ray Spectrometry, Ord. No. E632/113.101, Karlsruhe, FRG.
J. SHERMAN, Spectrochim. Acta, 7 (1955) 283.
J. SHERMAN, Spectromchim. Acta, 11 (1959) 466.
S. D. RASBERRY, K. F. J. HEINRICH, Anal. Chem., 46 (1974) 81.
C. J. SPARKS, Jr., Adv. X-Ray Anal., (1976) 19.
B. VREBOS, J. A. HELSEN, X-Ray Spectrom., 14 (1985) 27.
Z. W. WERFEL, X-Ray Spectrom., 15 (1986) 35.
A. KUCZUMOW, X-Ray Spectrom., 13 (1984) 23.
P. J. STATHAM, Anal. Chem., 49 (1977) 2149.
Z. LI-XING, X-Ray Spectrom., 13 (1984) 52.
G. A. YAGODIN, O. A. SINEFRIBOVA, A. M. CHEKIREV, Proc. Int. Solvent Extraction Conf., Vol. 3, 1974, p. 2209.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Afzal, M., Hanif, J., Hanif, I. et al. Determination of zirconium and hafnium in solution by X-ray fluorescence spectrometry. Journal of Radioanalytical and Nuclear Chemistry, Articles 139, 203–214 (1990). https://doi.org/10.1007/BF02061804
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF02061804