Abstract
The plasma resonance in semiconducting CdO with different electron concentrations has been investigated by means of reflectivity measurements on thin films with metallic substrate. The results — especially the dependence of the plasma frequency on carrier density — are discussed within the framework of the classical dispersion theory. At some films peculiarities of the reflectivity have been observed which suggest inhomogeneities of the electron concentration along the layer normal.
Article PDF
Similar content being viewed by others
Avoid common mistakes on your manuscript.
Author information
Authors and Affiliations
Additional information
Auszugsweise vorgetragen auf der Tagung des Fachausschusses Halbleiter 1969 in München.
Unser Dank gilt Herrn Dr. Uhle für seine Hilfe bei der numerischen Auswertung der Messungen, der Deutschen Forschungsgemeinschaft für finanzielle Unterstützung.
Rights and permissions
About this article
Cite this article
Bischoff, M., Finkenrath, H. & Waidelich, W. Optische Plasmaresonanz in CdO. Z. Physik 231, 193–202 (1970). https://doi.org/10.1007/BF01392510
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1007/BF01392510