Abstract
From the Stone Age on, developmental periods of mankind carry the names of materials. Materials determine the applicability of key technologies and these are in turn of major significance for the economic success and the social development in modern society. Today's high-tech materials are the consequence of an improved understanding of the structure and composition of matter and of the interplay of microstructure and minor and trace constituents. We can distinguish four basic dimensional structural categories of materials: (a) the atomic structure level; (b) the crystal, glassy or amorphous structural level; (c) the microstructural level; (d) the level of constructions. As an example, these structural levels are described in some detail for graphite, a material used extensively throughout Analytical Chemistry. Decisive differences at the microstructural level result in graphitic materials with very varying properties: polycrystalline electrographite, glassy carbon, and pyrolytic graphite. Examples for the use of these materials in ETAAS are discussed.
Structural features together with topochemical and trace chemical characteristics are studied today by a wide variety of analytical instrumentation and methods of modern materials analysis which can be grouped into four categories of techniques: (a) photon probe techniques; (b) electron probe techniques; (c) ion probe techniques; (d) electrical field probes.
The most important of those techniques are discussed shortly with respect to their main characteristics as lateral and depth resolution, detection sensitivity, additional bonding or structural information, depth profiling possibilities etc.
The constructions are the ultimate level of a materials structure. Structures of microelectronic components reach dimensionally into the domain of microstructure whereas constructions in heavy industry are of meter-ton dimensions. Progress in the use of materials as carriers of information is visualized by a morphological comparison of the sound tracks of conventional records with the information imprinted in optical discs.
It is important to conceive materials as dynamic systems with limited lifetime. Fatigue and recrystallization are prominent relevant phenomena which must be studied by microstructural and topochemical methods. Dispersion strengthened microalloys like TZM, HT-molybdenum and NS-tungsten are discussed as examples how materials can be improved with respect to their extended use under extreme conditions. Again, a thorough structural and topochemical characterization was the basis of a successful respective materials development although a multitude of relevant topochemical questions still remain to be solved.
Lifetime investigations are an essential tool of materials development as well as quality control. Relevant investigations for various tube materials for ETAAS are discussed.
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Abbreviations
- CFC:
-
Carbon fibre composite
- CMC:
-
Ceramic matrix composites
- COST:
-
Cooperation in science and technology
- COST 503:
-
COST-action in the field of powder metallurgy
- CVD:
-
Chemical vapour deposition
- CVI:
-
Chemical vapour infiltration
- EG:
-
Electrographite
- GC:
-
Glassy carbon
- HT-Mo:
-
High temperature molybdenum (Mo-microalloy doped with potassium silicate)
- JESSI:
-
Joint European Submicron Silicon Initiative
- MMC:
-
Metal matrix composites
- MOS:
-
Metal oxide semiconductor
- NS-W:
-
Non-sag tungsten (used for lamp filaments and evaporative metallization techniques)
- PACVD:
-
Plasma assisted chemical vapour deposition
- PG:
-
Pyrolytic graphite
- PMC:
-
Polymeric matrix composites
- PVD:
-
Physical vapour deposition
- TPG:
-
Total pyrolytic graphite
- TZM:
-
Molybdenum base alloy containing 0.5% Ti, 0.08% Zr und 0.025% C
- UHP:
-
Ultra high purity
- VLSI:
-
Very large scale integration
- AA:
-
Activation analysis
- AAS:
-
Atomic absorption spectrophotometry
- AEM:
-
Analytical electron microscopy
- AES:
-
Auger electron spectrometry or atomic emission spectrometry (only used in this work where it is clear that Auger electron spectrometry is not meant)
- AFP:
-
Atom force probe
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Ortner, H.M., Wilhartitz, P. The characterization of high-tech materials: Perspectives, challenges, trends. Mikrochim Acta 104, 177–214 (1991). https://doi.org/10.1007/BF01245508
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DOI: https://doi.org/10.1007/BF01245508