Abstract
Natural chalcopyrite (CuFeS2) specimens from Golden, New Mexico and Transvaal, South Africa were examined by transmission electron microscopy. The defect structure was composed of dislocations, dislocation loops, tangles, and substructure (including dislocation networks), stacking faults on {112} (both intrinsic and extrinsic), and mechanical twins and twin-faults. Optical microscopy indicated a large grain structure (0.3 to 0.5 cm grain size) containing numerous large twins similar in size to the average grain diameter. It is concluded that the absence of superdislocations of the type 1/4 〈201〉 is a result of the CuFeS2 structure approximating more closely the sphalerite lattice as a result of the c/a ratio approaching 2. It is also concluded that the apparently low stacking fault free energy in CuFeS2 will give rise to abundant mechanical twins accommodating large deformations, and this may be an important factor in the grinding and leaching of chalcopyrite concentrates. The observations suggest that the defect structure, particularly the occurrence of superdislocations and antiphase boundaries, might increase with a decrease in the c/a ratio for chalcopyrite structures, and this may have an important influence on the electrical and mechanical properties of compounds having the chalcopyrite structure.
Article PDF
Similar content being viewed by others
Explore related subjects
Discover the latest articles, news and stories from top researchers in related subjects.Avoid common mistakes on your manuscript.
References
A. S. Borshchevskii, N. A. Goryunova, F. Kesamancy, and D. N. Nasledov, Phys. Stat. Sol. 21 (1967) 9.
B. Ray, J Mater. Sci. 2 (1967) 284.
S. A. Mughal, A. J. Payne, and B. Ray, J. Mater. Sci., 4 (1969) 895.
“Ternary Chalcopyrite Semiconductors”, edited by J. L. Shay and J. H. Wernick, Vol. 7 of International Series on Surface Science of the Solid State (Pergamon Press, New York, 1975).
M. Pasemann and P. Klimanek, Kristall und Technik 8 (1973) 1141.
M. Pasemann, P. Klimanek, and H. Oettel, Phys. Stat. Sol. (a) 22 (1974) K1.
J. K. Gerlach, E. D. Gock and S. K. Ghosh, “International Symposium on Hydrometallurgy”, edited by D. J. I. Evans and R. S. Shoemaker (American Inst. of Mining, Metallurgical and Petroleum Engrs., New York, 1972) p. 403.
F. P. Hauer and M. M. Wong, J. Metals (Feb. 1971) 25.
J. Gerlach, F. Pawlek, R. Rödel, G. Schäde, and H. P. Wedigge, Erzmetall 25 (1972) 448.
Y. Monfort, J. Vizot, and A. Deschanvres, Phys. Stat. Sol. (a) 29 (1975) 551.
C. S. Barrett and T. B. Massalski, “Structure of Metals”, (McGraw-Hill, New York, 1966).
“Electron microscopy in mineralogy”, edited by H. -R. Wenk, P. E. Champness, J. M. Christy, J. M. Cowley, A. H. Heuer, G. Thomas, and N. J. Tighe (Springer Verlag, New York, 1976).
L. E. Murr, “Electron Optical Applications in Materials Science” (McGraw-Hill, New York, 1970).
L. E. Murr and F. I. Grace, Experimental Mechs. 5 (1969) 145.
L. E. Murr and K. P. Staudhammer, Mater. Sci. Engr. 20 (1975) 35.
L. E. Murr, Thin Solid Films 4 (1969) 389.
H. Hashimoto, A. Howie, and M. J. Whelan, Proc. Roy. Soc. A269 (1962) 80.
A. K. Head, P. Humble, L. M. Clarebrough, A. J. Morton, and C. T. Forwood, “Computed Electron Micrographs and Defect Identification”, (North-Holland, London, 1973).
L. E. Murr, “Interfacial Phenomena in Metals and Alloys”, (Addison-Wesley, Reading, Mass., 1975).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Murr, L.E., Lerner, S.L. Transmission electron microscopic study of defect structure in natural chalcopyrite (CuFeS2). J Mater Sci 12, 1349–1354 (1977). https://doi.org/10.1007/BF00540848
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1007/BF00540848