Summary
Infrared reflection spectroscopy has been used to investigate a series of poly(aryl-ether-ether-ketone) (PEEK) plaques of differing crystallinity. Correlations have been observed between intensity changes in the reflection spectra and the crystallinity as measured by wide angle X-ray scattering (WAXS). These correlations enable estimates to be made of the crystallinity close to the surface and complement the bulk data obtained by WAXS.
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Chalmers, J.M., Gaskin, W.F. & Mackenzie, M.W. Crystallinity in poly(aryl-ether-ketone) plaques studied by multiple internal reflection spectroscopy. Polymer Bulletin 11, 433–435 (1984). https://doi.org/10.1007/BF00265483
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DOI: https://doi.org/10.1007/BF00265483