Abstract
In a series of 30 unilaterally pseudophakic patients, electroretinograms and electrooculograms were recorded 6 months postoperatively. The unoperated on fellow eyes served as controls High intraoperative retinal light exposure (3.4–7.3 mW/cm2, Zeiss OPMI 6 operating microscope) caused a substantial reduction of electrophysiologic potentials. Light protection prevented deterioration of electroretinogram and electro-oculogram potentials; reducing the bulb voltage, tilting the axis of illumination, filtering short wavelengths and the use of light shields resulted in 4-log-unit lower intensities (0.8–3.7 μW/cm2).
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Abbreviations
- ACL:
-
anterior chamber lens
- ECCE:
-
extracapsular cataract extraction
- ICCE:
-
intracapsular cataract extraction
- PCL:
-
posterior chamber lens
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Lessel, M., Thaler, A., Heilig, P. et al. Intraoperative retinal light damage reflected in electrophysiologic data. Doc Ophthalmol 76, 323–333 (1991). https://doi.org/10.1007/BF00142670
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DOI: https://doi.org/10.1007/BF00142670